Mechanism of defects and electrode structure on the performance of AlN-based metal semiconductor metal detectors
文献类型：期刊论文
| 作者 | Li, Guanghui; Wang, Pengbo; He, Xinran; Meng, Yulong; Liang, Feng; Zhou, Mei; Zhao, Degang |
| 刊名 | MATERIALS RESEARCH EXPRESS
 |
| 出版日期 | 2021 |
| 卷号 | 8期号:12页码:125902 |
| 公开日期 | 2021 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/30755]  |
| 专题 | 半导体研究所_光电子研究发展中心 |
| 推荐引用方式 GB/T 7714 | Li, Guanghui; Wang, Pengbo; He, Xinran; Meng, Yulong; Liang, Feng; Zhou, Mei; Zhao, Degang. Mechanism of defects and electrode structure on the performance of AlN-based metal semiconductor metal detectors[J]. MATERIALS RESEARCH EXPRESS,2021,8(12):125902. |
| APA | Li, Guanghui; Wang, Pengbo; He, Xinran; Meng, Yulong; Liang, Feng; Zhou, Mei; Zhao, Degang.(2021).Mechanism of defects and electrode structure on the performance of AlN-based metal semiconductor metal detectors.MATERIALS RESEARCH EXPRESS,8(12),125902. |
| MLA | Li, Guanghui; Wang, Pengbo; He, Xinran; Meng, Yulong; Liang, Feng; Zhou, Mei; Zhao, Degang."Mechanism of defects and electrode structure on the performance of AlN-based metal semiconductor metal detectors".MATERIALS RESEARCH EXPRESS 8.12(2021):125902. |
入库方式： OAI收割
来源：半导体研究所
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