Directly Confirming the Z (1/2) Center as the Electron Trap in SiC Through Accessing the Nonradiative Recombination
文献类型：期刊论文
| 作者 | Gu, Yuxiang; Shi, Lin; Luo, Jun-Wei; Li, Shu-Shen; Wang, Lin-Wang |
| 刊名 | PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS
 |
| 出版日期 | 2021 |
| 卷号 | 16期号:2页码:2100458 |
| 公开日期 | 2021 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/30798]  |
| 专题 | 半导体研究所_半导体超晶格国家重点实验室 |
| 推荐引用方式 GB/T 7714 | Gu, Yuxiang; Shi, Lin; Luo, Jun-Wei; Li, Shu-Shen; Wang, Lin-Wang. Directly Confirming the Z (1/2) Center as the Electron Trap in SiC Through Accessing the Nonradiative Recombination[J]. PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS,2021,16(2):2100458. |
| APA | Gu, Yuxiang; Shi, Lin; Luo, Jun-Wei; Li, Shu-Shen; Wang, Lin-Wang.(2021).Directly Confirming the Z (1/2) Center as the Electron Trap in SiC Through Accessing the Nonradiative Recombination.PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS,16(2),2100458. |
| MLA | Gu, Yuxiang; Shi, Lin; Luo, Jun-Wei; Li, Shu-Shen; Wang, Lin-Wang."Directly Confirming the Z (1/2) Center as the Electron Trap in SiC Through Accessing the Nonradiative Recombination".PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS 16.2(2021):2100458. |
入库方式： OAI收割
来源：半导体研究所
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