Defects Induced Charge Trapping/Detrapping and Hysteresis Phenomenon in MoS2 Field-Effect Transistors: Mechanism Revealed by Anharmonic Marcus Charge Transfer Theory
文献类型：期刊论文
| 作者 | Ma, Xiaolei; Liu, Yue-Yang; Zeng, Lang; Chen, Jiezhi; Wang, Runsheng; Wang, Lin-Wang; Wu, Yanqing; Jiang, Xiangwei |
| 刊名 | ACS APPLIED MATERIALS & INTERFACES
 |
| 出版日期 | 2021 |
| 卷号 | 14期号:1页码:2185–2193 |
| 公开日期 | 2021 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/30725]  |
| 专题 | 半导体研究所_半导体超晶格国家重点实验室 |
| 推荐引用方式 GB/T 7714 | Ma, Xiaolei; Liu, Yue-Yang; Zeng, Lang; Chen, Jiezhi; Wang, Runsheng; Wang, Lin-Wang; Wu, Yanqing; Jiang, Xiangwei. Defects Induced Charge Trapping/Detrapping and Hysteresis Phenomenon in MoS2 Field-Effect Transistors: Mechanism Revealed by Anharmonic Marcus Charge Transfer Theory[J]. ACS APPLIED MATERIALS & INTERFACES,2021,14(1):2185–2193. |
| APA | Ma, Xiaolei; Liu, Yue-Yang; Zeng, Lang; Chen, Jiezhi; Wang, Runsheng; Wang, Lin-Wang; Wu, Yanqing; Jiang, Xiangwei.(2021).Defects Induced Charge Trapping/Detrapping and Hysteresis Phenomenon in MoS2 Field-Effect Transistors: Mechanism Revealed by Anharmonic Marcus Charge Transfer Theory.ACS APPLIED MATERIALS & INTERFACES,14(1),2185–2193. |
| MLA | Ma, Xiaolei; Liu, Yue-Yang; Zeng, Lang; Chen, Jiezhi; Wang, Runsheng; Wang, Lin-Wang; Wu, Yanqing; Jiang, Xiangwei."Defects Induced Charge Trapping/Detrapping and Hysteresis Phenomenon in MoS2 Field-Effect Transistors: Mechanism Revealed by Anharmonic Marcus Charge Transfer Theory".ACS APPLIED MATERIALS & INTERFACES 14.1(2021):2185–2193. |
入库方式： OAI收割
来源：半导体研究所
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