The influence of nano-particle tracers on the slip length measurements by microPTV
文献类型：期刊论文
| 作者 | Zheng X(郑旭); Kong GP(孔高攀) ; Li ZH(李战华)
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| 刊名 | ACTA MECHANICA SINICA
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| 出版日期 | 2013-06-25 |
| 卷号 | 29期号:3页码:411-419 |
| 通讯作者邮箱 | lili@imech.ac.cn |
| 关键词 | MicroPIV/PTV Slip length Nano-particle tracer Particle concentration distribution Boltzmann distribution |
| ISSN号 | 0567-7718 |
| 产权排序 | [Zheng, Xu; Kong, Gao-Pan; Silber-Li, Zhan-Hua] Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech, Beijing 100190, Peoples R China |
| 通讯作者 | Silber-Li, ZH (reprint author), Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech, Beijing 100190, Peoples R China. |
| 中文摘要 | Direct measurement of slip length is based on the measured fluid velocity near solid boundary. However, previous micro particle image velocimetry/particle tracking velocimetry (microPIV/PTV) measurements have reported surprisingly large measured near-wall velocities of pressure-driven flow in apparent contradiction with the no-slip hypothesis and experimental results from other techniques. To better interpret the measured results of the microPIV/PTV, we performed velocity profile measurements near a hydrophilic wall (z = 0.25-1.5 mu m) with two sizes of tracer particles (phi 50 nm and phi 200 nm). The experimental results indicate that, at less than 1 mu m from the wall, the deviations between the measured velocities and no-slip theoretical values obviously decrease from 93% of phi 200 nm particles to 48% of phi 50 nm particles. The Boltzmann-like exponential measured particle concentrations near wall were found. Based on the non linear Boltzmann distribution of particle concentration and the effective focus plane thickness, we illustrated the reason of the apparent velocity increase near wall and proposed a method to correct the measured velocity profile. By this method, the deviations between the corrected measured velocities and the no-slip theoretical velocity decrease from 45.8% to 10%, and the measured slip length on hydrophilic glass is revised from 75 nm to 16 nm. These results indicated that the particle size and the biased particle concentration distribution can significantly affect near wall velocity measurement via microPIV/PTV, and result in larger measured velocity and slip length close to wall. |
| 学科主题 | 实验流体力学 |
| 分类号 | 二类 |
| 收录类别 | SCI ; EI ; CSCD |
| 资助信息 | National Natural Science Foundation of China [10872203]; National Basic Research Program [2007AC744701]; CAS Research and Development Program of China [KSCX2-YW-H18] |
| 原文出处 | http://dx.doi.org/10.1007/s10409-013-0027-0 |
| 语种 | 英语 |
| WOS记录号 | WOS:000323736400012 |
| 公开日期 | 2013-09-27 |
| 源URL | [http://dspace.imech.ac.cn/handle/311007/47451]  |
| 专题 | 力学研究所_非线性力学国家重点实验室 |
| 推荐引用方式 GB/T 7714 | Zheng X,Kong GP,Li ZH. The influence of nano-particle tracers on the slip length measurements by microPTV[J]. ACTA MECHANICA SINICA,2013,29(3):411-419. |
| APA | Zheng X,Kong GP,&Li ZH.(2013).The influence of nano-particle tracers on the slip length measurements by microPTV.ACTA MECHANICA SINICA,29(3),411-419. |
| MLA | Zheng X,et al."The influence of nano-particle tracers on the slip length measurements by microPTV".ACTA MECHANICA SINICA 29.3(2013):411-419. |
入库方式： OAI收割
来源：力学研究所
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