Accuracy enhanced microwave frequency measurement based on the machine learning technique
文献类型：期刊论文
| 作者 | Shi, Difei; Li, Guangyi; Jia, Zhiyao; Wen, Jun; Li, Ming; Zhu, Ninghua; Li, Wei |
| 刊名 | OPTICS EXPRESS
 |
| 出版日期 | 2021 |
| 卷号 | 29期号:13页码:19515-19524 |
| 语种 | 英语 |
| 公开日期 | 2021 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/30937]  |
| 专题 | 半导体研究所_光电子研究发展中心 |
| 推荐引用方式 GB/T 7714 | Shi, Difei; Li, Guangyi; Jia, Zhiyao; Wen, Jun; Li, Ming; Zhu, Ninghua; Li, Wei. Accuracy enhanced microwave frequency measurement based on the machine learning technique[J]. OPTICS EXPRESS,2021,29(13):19515-19524. |
| APA | Shi, Difei; Li, Guangyi; Jia, Zhiyao; Wen, Jun; Li, Ming; Zhu, Ninghua; Li, Wei.(2021).Accuracy enhanced microwave frequency measurement based on the machine learning technique.OPTICS EXPRESS,29(13),19515-19524. |
| MLA | Shi, Difei; Li, Guangyi; Jia, Zhiyao; Wen, Jun; Li, Ming; Zhu, Ninghua; Li, Wei."Accuracy enhanced microwave frequency measurement based on the machine learning technique".OPTICS EXPRESS 29.13(2021):19515-19524. |
入库方式： OAI收割
来源：半导体研究所
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