Interpretation of Compressive Strain Causing Critical Current Degradation of Bi2212 Round Wires
文献类型：期刊论文
| 作者 | Wang, Yi-Feng3; Jiang, Zhao-Fei2; Zhang, Zhao-Xia1; Gou, Xiao-Fan3 |
| 刊名 | IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
 |
| 出版日期 | 2022-08-01 |
| 卷号 | 32 |
| 关键词 | Bi2Sr2CaCu2Ox (Bi2212) round wires (RWs) buckling compressive strain critical current degradation tensile damage |
| ISSN号 | 1051-8223 |
| DOI | 10.1109/TASC.2022.3157347 |
| 通讯作者 | Gou, Xiao-Fan(xfgou@hhu.edu.cn) |
| 英文摘要 | High-temperature superconducting Bi2Sr2CaCu2Ox (Bi2212) round wires (RWs) are multicomponent composite structure with superconductor Bi2Sr2CaCu2Ox as the fiber core, metallic silver (Ag) as the matrix, and a silver-magnesium alloy sheath (Ag-Mg) wrapped on the outside. The microstructure of Bi2212 RWs is found to be extremely complicated due to complex preparation process, which mainly manifested in irregular Bi2212/Ag interfaces and porous structure of Bi2212 filaments. For such Bi2212 multifilament RWs, many studies reported applied strain causing degradation of the critical current (I-c), but only a few focused on exploring the mechanism of strain dependence of the I-c degradation during a larger strain range spanning from compressive to tensile one. Based on our previous work of modeling the I-c degradation under applied tensile strain, in this work, we tried to further interpret why applied compressive strain makes the I-c of Bi2212 RWs drop rapidly. By using the numerical model on fully taking account of irregular Bi2212/Ag interfaces, we found that buckling deformation of Bi2212 wires, even smaller, arises after heat treatment. And, for a Bi2212 composite RW with thermal residual strain accumulation, under applied compressive strain, the results indicate that the reason of the critical current degradation is essentially tensile failure of Bi2212 filaments, which results from buckling deformation of the whole wire. Furthermore, on the current shunt model we proposed previously, the relation curve of the I-c/I-c0 versus applied compressive strain was obtained, which is well-agree with experimental data. And on these results, electromechanical analysis revealed that this relation of I-c/I-c0 versus applied compressive strain results both from tensile damage of Bi2212 filaments, and subsequently current flowing cross the Bi2212/Ag interface and into Ag matrix near cracks inside filaments. |
| WOS关键词 | MAGNETIC-FIELDS ; COMPOSITE TAPES ; AXIAL STRAIN ; SUPERCONDUCTOR ; DEPENDENCE ; FILAMENTS ; FRACTURE ; DENSE |
| 资助项目 | National Science Foundation of China[12072101] |
| WOS研究方向 | Engineering ; Physics |
| 语种 | 英语 |
| WOS记录号 | WOS:000780390400001 |
| 出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
| 资助机构 | National Science Foundation of China |
| 源URL | [http://ir.hfcas.ac.cn:8080/handle/334002/128445]  |
| 专题 | 中国科学院合肥物质科学研究院 |
| 通讯作者 | Gou, Xiao-Fan |
| 作者单位 | 1.Jiangsu Univ, Fac Civil Engn & Mech, Zhenjiang 212013, Jiangsu, Peoples R China 2.Chinese Acad Sci, Hefei Inst Phys Sci, High Magnet Field Lab, Hefei 230031, Peoples R China 3.Hohai Univ, Coll Mech & Mat, Nanjing 211100, Peoples R China |
| 推荐引用方式 GB/T 7714 | Wang, Yi-Feng,Jiang, Zhao-Fei,Zhang, Zhao-Xia,et al. Interpretation of Compressive Strain Causing Critical Current Degradation of Bi2212 Round Wires[J]. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY,2022,32. |
| APA | Wang, Yi-Feng,Jiang, Zhao-Fei,Zhang, Zhao-Xia,&Gou, Xiao-Fan.(2022).Interpretation of Compressive Strain Causing Critical Current Degradation of Bi2212 Round Wires.IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY,32. |
| MLA | Wang, Yi-Feng,et al."Interpretation of Compressive Strain Causing Critical Current Degradation of Bi2212 Round Wires".IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY 32(2022). |
入库方式： OAI收割
来源：合肥物质科学研究院
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。