中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Centimeter-scale low-damage micromachining on single-crystal 4H-SiC substrates using a femtosecond laser with square-shaped Flat-Top focus spots

文献类型:期刊论文

作者Long, Jiangyou;   Peng, Qingfa;   Chen, Gaopan;   Zhang, Yuliang;   Xie, Xiaozhu;   Pan, Guoshun;   Wang, Xiaofeng
刊名CERAMICS INTERNATIONAL
出版日期2021
卷号47期号:16页码:23134-23143
公开日期2021
源URL[http://ir.semi.ac.cn/handle/172111/30971]  
专题半导体研究所_中科院半导体照明研发中心
推荐引用方式
GB/T 7714
Long, Jiangyou; Peng, Qingfa; Chen, Gaopan; Zhang, Yuliang; Xie, Xiaozhu; Pan, Guoshun; Wang, Xiaofeng. Centimeter-scale low-damage micromachining on single-crystal 4H-SiC substrates using a femtosecond laser with square-shaped Flat-Top focus spots[J]. CERAMICS INTERNATIONAL,2021,47(16):23134-23143.
APA Long, Jiangyou; Peng, Qingfa; Chen, Gaopan; Zhang, Yuliang; Xie, Xiaozhu; Pan, Guoshun; Wang, Xiaofeng.(2021).Centimeter-scale low-damage micromachining on single-crystal 4H-SiC substrates using a femtosecond laser with square-shaped Flat-Top focus spots.CERAMICS INTERNATIONAL,47(16),23134-23143.
MLA Long, Jiangyou; Peng, Qingfa; Chen, Gaopan; Zhang, Yuliang; Xie, Xiaozhu; Pan, Guoshun; Wang, Xiaofeng."Centimeter-scale low-damage micromachining on single-crystal 4H-SiC substrates using a femtosecond laser with square-shaped Flat-Top focus spots".CERAMICS INTERNATIONAL 47.16(2021):23134-23143.

入库方式: OAI收割

来源:半导体研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。