A frequency mapping method for locating functional units inside ICs based on coaxial microscope
文献类型：期刊论文
| 作者 | Liu, Pengcheng1,3 ; Han, Jianwei1,3; Ma, Yingqi1,3; Zhang, Feng2; Wu, Zongguo2; Zhu, Xiang1,3; Cui, Yixin1,3
|
| 刊名 | ELECTRONICS LETTERS
 |
| 出版日期 | 2021-11-18 |
| 页码 | 3 |
| ISSN号 | 0013-5194 |
| DOI | 10.1049/ell2.12373 |
| 通讯作者 | Ma, Yingqi(myq@nssc.ac.cn) |
| 英文摘要 | Locating the physical position of functional units of the chip is a mandatory first step in various fields of applications, such as reverse engineering and hardware security. This paper presents a frequency mapping method based on the coaxial microscope to locate functional units inside ICs. A visible light camera is employed to focus the laser on the active region of the device under test based on the principle that the laser is strongly reflected at the metal in the active region. The target circuit modulates the laser at its operating frequency and the position of the target circuit could be accurately located by analyzing the frequency characteristics of the reflected laser. The results of transceiver chip localization indicate that the target circuit on the chip can be precisely located by this method without any additional processing of the chip. The coaxial microscopy design provides a good spot quality and signal-to-noise ratio, meanwhile, locating areas of the chip with operating currents down to 10(-10) A, compared with that of photonic emission analysis can only achieve the sensitivity of 5 x 10(-4) A. The sensitivity of the frequency mapping method is much better than that of Photonic Emission Analysis. |
| 资助项目 | Foundation for Study Encouragement to Youth Innovation Promotion Association Member of Chinese Academy of Sciences[2018179] ; Beijing Municipal Science and Technology Commission[Z201100003520002] |
| WOS研究方向 | Engineering |
| 语种 | 英语 |
| WOS记录号 | WOS:000719862600001 |
| 出版者 | WILEY |
| 资助机构 | Foundation for Study Encouragement to Youth Innovation Promotion Association Member of Chinese Academy of Sciences ; Beijing Municipal Science and Technology Commission |
| 源URL | [http://ir.ia.ac.cn/handle/173211/46488]  |
| 专题 | 国家专用集成电路设计工程技术研究中心_微电子与系统技术 自动化研究所_国家专用集成电路设计工程技术研究中心 |
| 通讯作者 | Ma, Yingqi |
| 作者单位 | 1.Chinese Acad Sci, Natl Space Sci Ctr, Space Environm Effects Lab, Beijing, Peoples R China 2.Chinese Acad Sci, Natl Engn & Technol Res Ctr ASIC Design, Inst Automat, Beijing, Peoples R China 3.Univ Chinese Acad Sci, Sch Astron & Space Sci, Beijing, Peoples R China |
| 推荐引用方式 GB/T 7714 | Liu, Pengcheng,Han, Jianwei,Ma, Yingqi,et al. A frequency mapping method for locating functional units inside ICs based on coaxial microscope[J]. ELECTRONICS LETTERS,2021:3. |
| APA | Liu, Pengcheng.,Han, Jianwei.,Ma, Yingqi.,Zhang, Feng.,Wu, Zongguo.,...&Cui, Yixin.(2021).A frequency mapping method for locating functional units inside ICs based on coaxial microscope.ELECTRONICS LETTERS,3. |
| MLA | Liu, Pengcheng,et al."A frequency mapping method for locating functional units inside ICs based on coaxial microscope".ELECTRONICS LETTERS (2021):3. |
入库方式： OAI收割
来源：自动化研究所
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