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Abnormal area identification of corn ear based on semi-supervised learning

文献类型：期刊论文

作者Wei, Jian2; Ma, Qin1,2; Wang, Weitao2; Guo, Hao5; Liu, Zhe5; Zhang, Jiajing3,4
刊名IET IMAGE PROCESSING
出版日期2022-04-14
页码10
ISSN号1751-9659
DOI10.1049/ipr2.12492
通讯作者Ma, Qin(sockline@163.com)
英文摘要Screening corn ear is the key link in the breeding process of new varieties. But manual testing is difficult to measure the proportion of abnormal area. Meanwhile, the abnormal areas are mainly caused by mildew, moth and mechanical collision. A new refined semantic segmentation model was proposed based on the semi-supervised learning method of generating antagonistic networks (GAN). Besides k-means algorithm was used to remove a large amount of background information for data preprocessing. By using feature fusion and weighted loss function the model performance was improved. The introduction of transfer learning accelerated model convergence. Through the high-throughput corn ear collection system, 1448 ear images (including abnormal conditions such as mildew, moth and mechanical damage) were collected and labelled. The proposed method was tested on real corn ear images with an accuracy of 0.950, mean precision of 0.933, mean IoU of 0.884, and FwIoU of 0.908. Experimental results show that the proposed method has better performance than general networks.
资助项目[2021ZD0113701]
WOS研究方向Computer Science ; Engineering ; Imaging Science & Photographic Technology
语种英语
WOS记录号WOS:000782384000001
出版者WILEY
源URL[http://ir.ia.ac.cn/handle/173211/48280]  
专题自动化研究所_复杂系统管理与控制国家重点实验室_互联网大数据与安全信息学研究中心
通讯作者Ma, Qin
作者单位1.Minist Agr & Rural Affairs, Key Lab Agr Machinery Monitoring & Big Data Appli, Beijing, Peoples R China
2.China Agr Univ, Coll Informat & Elect Engn, Beijing 100083, Peoples R China
3.Chinese Acad Sci, Inst Automat, State Key Lab Management & Control Complex Syst, Beijing, Peoples R China
4.Univ Chinese Acad Sci, Sch Artificial Intelligence, Beijing, Peoples R China
5.China Agr Univ, Coll Land Sci & Technol, Beijing, Peoples R China
推荐引用方式
GB/T 7714		 Wei, Jian,Ma, Qin,Wang, Weitao,et al. Abnormal area identification of corn ear based on semi-supervised learning[J]. IET IMAGE PROCESSING,2022:10.
APA Wei, Jian,Ma, Qin,Wang, Weitao,Guo, Hao,Liu, Zhe,&Zhang, Jiajing.(2022).Abnormal area identification of corn ear based on semi-supervised learning.IET IMAGE PROCESSING,10.
MLA Wei, Jian,et al."Abnormal area identification of corn ear based on semi-supervised learning".IET IMAGE PROCESSING (2022):10.

入库方式： OAI收割

来源：自动化研究所

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