Structural Brain Atrophy Predict Symptom Severity in Schizophrenia Based on Generalized Additive Models
文献类型:会议论文
作者 | Wang, Meng3,4; Fan, Lingzhong3,4; Liu, Bing1,2 |
出版日期 | 2022-04-26 |
会议日期 | 28-31 March 2022 |
会议地点 | Kolkata, India |
关键词 | Schizophrenia Prediction Generalized Additive Models Symptom Severity Brain Atrophy |
英文摘要 | Schizophrenia (SCZ) patients typically vary significantly in symptom severity. Despite numerous studies demonstrate SCZ is linked to brain structure abnormalities, relationships are obscure. In this paper, we establish relationships between structural abnormalities and symptom severity. All analyses are performed in two datasets (discovery: 326 SCZ and 298 normal control (NC); replication: 216 SCZ and 173 NC). We first build normative models in NC group, based on which we calculate atrophy values of cortical thickness, surface area, and gray matter volume in SCZ. Finally, we use atrophy values to predict symptom severity via generalized additive models and further evaluate the marginal effect of each structural feature. We found atrophy values could reliably predict symptom severity across two datasets (discovery: Pearson r = 0.29, P < 1 × 10-5; replication: r = 0.26, P = 3 × 10-5). Our findings could aid in understanding the pathogenesis of symptoms in SCZ. |
会议录出版者 | IEEE |
语种 | 英语 |
源URL | [http://ir.ia.ac.cn/handle/173211/48754] |
专题 | 自动化研究所_脑网络组研究中心 |
通讯作者 | Liu, Bing |
作者单位 | 1.Chinese Institute for Brain Research, Beijing, China 2.State Key Laboratory of Cognitive Neuroscience and Learning, Beijing Normal University, Beijing, China 3.School of Artificial Intelligence, University of Chinese Academy of Sciences, Beijing, China 4.Brainnetome Center and National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences, Beijing, China |
推荐引用方式 GB/T 7714 | Wang, Meng,Fan, Lingzhong,Liu, Bing. Structural Brain Atrophy Predict Symptom Severity in Schizophrenia Based on Generalized Additive Models[C]. 见:. Kolkata, India. 28-31 March 2022. |
入库方式: OAI收割
来源:自动化研究所
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