中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Structural Brain Atrophy Predict Symptom Severity in Schizophrenia Based on Generalized Additive Models

文献类型:会议论文

作者Wang, Meng3,4; Fan, Lingzhong3,4; Liu, Bing1,2
出版日期2022-04-26
会议日期28-31 March 2022
会议地点Kolkata, India
关键词Schizophrenia Prediction Generalized Additive Models Symptom Severity Brain Atrophy
英文摘要

Schizophrenia (SCZ) patients typically vary significantly in symptom severity. Despite numerous studies demonstrate SCZ is linked to brain structure abnormalities, relationships are obscure. In this paper, we establish relationships between structural abnormalities and symptom severity. All analyses are performed in two datasets (discovery: 326 SCZ and 298 normal control (NC); replication: 216 SCZ and 173 NC). We first build normative models in NC group, based on which we calculate atrophy values of cortical thickness, surface area, and gray matter volume in SCZ. Finally, we use atrophy values to predict symptom severity via generalized additive models and further evaluate the marginal effect of each structural feature. We found atrophy values could reliably predict symptom severity across two datasets (discovery: Pearson r = 0.29, P < 1 × 10-5; replication: r = 0.26, P = 3 × 10-5). Our findings could aid in understanding the pathogenesis of symptoms in SCZ.

会议录出版者IEEE
语种英语
源URL[http://ir.ia.ac.cn/handle/173211/48754]  
专题自动化研究所_脑网络组研究中心
通讯作者Liu, Bing
作者单位1.Chinese Institute for Brain Research, Beijing, China
2.State Key Laboratory of Cognitive Neuroscience and Learning, Beijing Normal University, Beijing, China
3.School of Artificial Intelligence, University of Chinese Academy of Sciences, Beijing, China
4.Brainnetome Center and National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences, Beijing, China
推荐引用方式
GB/T 7714
Wang, Meng,Fan, Lingzhong,Liu, Bing. Structural Brain Atrophy Predict Symptom Severity in Schizophrenia Based on Generalized Additive Models[C]. 见:. Kolkata, India. 28-31 March 2022.

入库方式: OAI收割

来源:自动化研究所

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