Application of Raman imaging and scanning electron microscopy techniques for the advanced characterization of geological samples
文献类型：期刊论文
| 作者 | Yuan, Jiangyan; Su, Wen; Hu, Xinmeng; Li, Xiaoguang; Fei, Chenhui |
| 刊名 | MICROSCOPY RESEARCH AND TECHNIQUE
 |
| 出版日期 | 2022-03-03 |
| 页码 | 11 |
| 关键词 | isomorphism organic matter polymorphism RISE tiny inclusion |
| ISSN号 | 1059-910X |
| DOI | 10.1002/jemt.24093 |
| 英文摘要 | Raman is an important tool for diagnosing minerals in geoscience. However, smaller magnification of optical microscope assembled in conventional Raman spectroscopy limits the application of Raman in sub-micro and nano scale. Raman imaging and scanning electron microscopy (RISE) combine the advantage of scanning electron microscope and Raman spectroscopy, which can collect the morphology, composition, and structure information in the same micro region of the geological sample in situ. In this paper, we introduce the development and working mechanism of RISE, and carried out some typical applications in different research of geoscience. The purpose of this review is to allow readers to understand the basic principles and application potential of RISE in geoscience. Finally, we briefly point out current challenges faced by this technology and some research directions in the future. |
| WOS关键词 | ORGANIC-MATTER ; COESITE TRANSFORMATION ; PHASE-TRANSFORMATION ; THERMAL MATURITY ; MELT INCLUSIONS ; SPECTROSCOPY ; MINERALS ; SPECTRA ; QUARTZ ; FLUID |
| 资助项目 | Technological Research Funds for the Institute of Geology and Geophysics, Chinese Academy of Sciences[E151850601] ; Technological Research Funds for the Institute of Geology and Geophysics, Chinese Academy of Sciences[E051850401] |
| WOS研究方向 | Anatomy & Morphology ; Life Sciences & Biomedicine - Other Topics ; Microscopy |
| 语种 | 英语 |
| WOS记录号 | WOS:000763513500001 |
| 出版者 | WILEY |
| 资助机构 | Technological Research Funds for the Institute of Geology and Geophysics, Chinese Academy of Sciences ; Technological Research Funds for the Institute of Geology and Geophysics, Chinese Academy of Sciences ; Technological Research Funds for the Institute of Geology and Geophysics, Chinese Academy of Sciences ; Technological Research Funds for the Institute of Geology and Geophysics, Chinese Academy of Sciences ; Technological Research Funds for the Institute of Geology and Geophysics, Chinese Academy of Sciences ; Technological Research Funds for the Institute of Geology and Geophysics, Chinese Academy of Sciences ; Technological Research Funds for the Institute of Geology and Geophysics, Chinese Academy of Sciences ; Technological Research Funds for the Institute of Geology and Geophysics, Chinese Academy of Sciences ; Technological Research Funds for the Institute of Geology and Geophysics, Chinese Academy of Sciences ; Technological Research Funds for the Institute of Geology and Geophysics, Chinese Academy of Sciences ; Technological Research Funds for the Institute of Geology and Geophysics, Chinese Academy of Sciences ; Technological Research Funds for the Institute of Geology and Geophysics, Chinese Academy of Sciences ; Technological Research Funds for the Institute of Geology and Geophysics, Chinese Academy of Sciences ; Technological Research Funds for the Institute of Geology and Geophysics, Chinese Academy of Sciences ; Technological Research Funds for the Institute of Geology and Geophysics, Chinese Academy of Sciences ; Technological Research Funds for the Institute of Geology and Geophysics, Chinese Academy of Sciences |
| 源URL | [http://ir.iggcas.ac.cn/handle/132A11/104955]  |
| 专题 | 地质与地球物理研究所_岩石圈演化国家重点实验室 |
| 通讯作者 | Yuan, Jiangyan; Su, Wen |
| 作者单位 | Chinese Acad Sci, Inst Geol & Geophys, State Key Lab Lithospher Evolut, Beijing 100029, Peoples R China |
| 推荐引用方式 GB/T 7714 | Yuan, Jiangyan,Su, Wen,Hu, Xinmeng,et al. Application of Raman imaging and scanning electron microscopy techniques for the advanced characterization of geological samples[J]. MICROSCOPY RESEARCH AND TECHNIQUE,2022:11. |
| APA | Yuan, Jiangyan,Su, Wen,Hu, Xinmeng,Li, Xiaoguang,&Fei, Chenhui.(2022).Application of Raman imaging and scanning electron microscopy techniques for the advanced characterization of geological samples.MICROSCOPY RESEARCH AND TECHNIQUE,11. |
| MLA | Yuan, Jiangyan,et al."Application of Raman imaging and scanning electron microscopy techniques for the advanced characterization of geological samples".MICROSCOPY RESEARCH AND TECHNIQUE (2022):11. |
入库方式： OAI收割
来源：地质与地球物理研究所
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