Characterizing microring resonators using optical frequency domain reflectometry
文献类型：期刊论文
| 作者 | Zhang, Xiaopei; Yin, Yuexin; Yin, Xiaojie; Wen, Yongqiang; Zhang, Xiaolei; Liu, Xiaoping; Lv, Haibin |
| 刊名 | OPTICS LETTERS
 |
| 出版日期 | 2021 |
| 卷号 | 46期号:10页码:2400-2403 |
| 语种 | 英语 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/31093]  |
| 专题 | 半导体研究所_光电子研究发展中心 |
| 推荐引用方式 GB/T 7714 | Zhang, Xiaopei; Yin, Yuexin; Yin, Xiaojie; Wen, Yongqiang; Zhang, Xiaolei; Liu, Xiaoping; Lv, Haibin. Characterizing microring resonators using optical frequency domain reflectometry[J]. OPTICS LETTERS,2021,46(10):2400-2403. |
| APA | Zhang, Xiaopei; Yin, Yuexin; Yin, Xiaojie; Wen, Yongqiang; Zhang, Xiaolei; Liu, Xiaoping; Lv, Haibin.(2021).Characterizing microring resonators using optical frequency domain reflectometry.OPTICS LETTERS,46(10),2400-2403. |
| MLA | Zhang, Xiaopei; Yin, Yuexin; Yin, Xiaojie; Wen, Yongqiang; Zhang, Xiaolei; Liu, Xiaoping; Lv, Haibin."Characterizing microring resonators using optical frequency domain reflectometry".OPTICS LETTERS 46.10(2021):2400-2403. |
入库方式： OAI收割
来源：半导体研究所
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