中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Resistive Switching Characteristics Improved by Visible-Light Irradiation in a Cs2AgBiBr6-Based Memory Device

文献类型:期刊论文

作者Lv, Fengzhen; Zhong, Tingting; Qin, Yongfu; Qin, Haijun; Wang, Wenfeng; Liu, Fuchi; Kong, Wenjie
刊名NANOMATERIALS
出版日期2021
卷号11期号:6
关键词NEGATIVE DIFFERENTIAL RESISTANCE DOUBLE PEROVSKITE MEMRISTIVE DEVICES THIN-FILMS
英文摘要Light-modulated lead-free perovskites-based memristors, combining photoresponse and memory, are promising as multifunctional devices. In this work, lead-free double perovskite Cs2AgBiBr6 films with dense surfaces and uniform grains were prepared by the low-temperature sol-gel method on indium tin oxide (ITO) substrates. A memory device based on a lead-free double perovskite Cs2AgBiBr6 film, Pt/Cs2AgBiBr6/ITO/glass, presents obvious bipolar resistive switching behavior. The R-OFF/R-ON ratio under 445 nm wavelength light illumination is similar to 100 times greater than that in darkness. A long retention capability (>2400 s) and cycle-to-cycle consistency (>500 times) were observed in this device under light illumination. The resistive switching behavior is primarily attributed to the trap-controlled space-charge-limited current mechanism caused by bromine vacancies in the Cs2AgBiBr6 medium layer. Light modulates resistive states by regulating the condition of photo-generated carriers and changing the Schottky-like barrier of the Pt/Cs2AgBiBr6 interface under bias voltage sweeping.
源URL[http://ir.nimte.ac.cn/handle/174433/21857]  
专题中国科学院宁波材料技术与工程研究所
2021专题_期刊论文
作者单位1.Lv, FZ
2.Liu, FC (corresponding author), Guangxi Normal Univ, Sch Phys Sci & Technol, Guangxi Key Lab Nucl Phys & Technol, Guilin 541004, Peoples R China.
推荐引用方式
GB/T 7714
Lv, Fengzhen,Zhong, Tingting,Qin, Yongfu,et al. Resistive Switching Characteristics Improved by Visible-Light Irradiation in a Cs2AgBiBr6-Based Memory Device[J]. NANOMATERIALS,2021,11(6).
APA Lv, Fengzhen.,Zhong, Tingting.,Qin, Yongfu.,Qin, Haijun.,Wang, Wenfeng.,...&Kong, Wenjie.(2021).Resistive Switching Characteristics Improved by Visible-Light Irradiation in a Cs2AgBiBr6-Based Memory Device.NANOMATERIALS,11(6).
MLA Lv, Fengzhen,et al."Resistive Switching Characteristics Improved by Visible-Light Irradiation in a Cs2AgBiBr6-Based Memory Device".NANOMATERIALS 11.6(2021).

入库方式: OAI收割

来源:宁波材料技术与工程研究所

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