Terahertz detection of thin defects thickness based on Hilbert transform and power spectrum estimation
文献类型：期刊论文
| 作者 | Wang Jie2; Tan Bing-Chong2; Tao Xing-Zhu2; Xu Cheng-Cheng2; Chang Tian-Ying2; Cui Hong-Liang1,2 ; Zhang Jin2
|
| 刊名 | JOURNAL OF INFRARED AND MILLIMETER WAVES
 |
| 出版日期 | 2022-06-01 |
| 卷号 | 41期号:3页码:589-596 |
| 关键词 | terahertz time domain spectroscopy thickness estimation Hilbert transform power spectrum estimation glass fiber laminate |
| ISSN号 | 1001-9014 |
| DOI | 10.11972/j.issn.1001-9014.2022.03.010 |
| 通讯作者 | Wang Jie(wangjie16831@163.com) ; Zhang Jin(zhangjin0109@jlu.edu.cn) |
| 英文摘要 | A spectral analysis algorithm based on the combination of Hilbert transform(HT)and power spectrum estimation has been proposed,and the terahertz reflection time domain waveform was processed. At the same time,the algorithm was applied to terahertz time domain spectroscopy imaging,defect thickness was correlated with image gray level,and the thickness,position and shape of defects in glass fiber laminate can be detected by imaging simultaneously. The experimental results show that when the multi-signal classification(MUSIC)spectrum estimation and auto regressive(AR)spectrum estimation are combined with Hilbert transform,the reflected pulses between upper and lower surfaces of defect with thickness of 0. 08 mm can be successfully distinguished,the time resolution of reflected pulses is higher than 0. 5 ps,and the detection error of defect thickness is no more than 0. 03 mm. |
| 资助项目 | Natural Science Foundation of Shandong Province[ZR2020KF007] |
| WOS研究方向 | Optics |
| 语种 | 英语 |
| WOS记录号 | WOS:000833515400010 |
| 出版者 | SCIENCE PRESS |
| 源URL | [http://119.78.100.138/handle/2HOD01W0/16420]  |
| 专题 | 中国科学院重庆绿色智能技术研究院 |
| 通讯作者 | Wang Jie; Zhang Jin |
| 作者单位 | 1.Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Chongqing 400714, Peoples R China 2.Jilin Univ, Coll Instrumentat & Elect Engn, Changchun 130061, Peoples R China |
| 推荐引用方式 GB/T 7714 | Wang Jie,Tan Bing-Chong,Tao Xing-Zhu,et al. Terahertz detection of thin defects thickness based on Hilbert transform and power spectrum estimation[J]. JOURNAL OF INFRARED AND MILLIMETER WAVES,2022,41(3):589-596. |
| APA | Wang Jie.,Tan Bing-Chong.,Tao Xing-Zhu.,Xu Cheng-Cheng.,Chang Tian-Ying.,...&Zhang Jin.(2022).Terahertz detection of thin defects thickness based on Hilbert transform and power spectrum estimation.JOURNAL OF INFRARED AND MILLIMETER WAVES,41(3),589-596. |
| MLA | Wang Jie,et al."Terahertz detection of thin defects thickness based on Hilbert transform and power spectrum estimation".JOURNAL OF INFRARED AND MILLIMETER WAVES 41.3(2022):589-596. |
入库方式： OAI收割
来源：重庆绿色智能技术研究院
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