A Compact Low Energy Electron Microscope for Surface Analysis
文献类型：期刊论文
| 作者 | Zhang, Guan-hua1; Sun, Ju-long1; Jin, Yan-ling1; Zang, Kan2; Guo, Fang-zhun2; Yang, Xue-ming1 |
| 刊名 | chinese journal of chemical physics
 |
| 出版日期 | 2013-08-27 |
| 卷号 | 26期号:4页码:369-373 |
| 关键词 | Low energy electron microscopy Flange-on Femtosecond laser Lateral resolution Small deflection angle |
| ISSN号 | 1674-0068 |
| 产权排序 | 1,1 |
| 通讯作者 | 张冠华 ; 杨学明 |
| 英文摘要 | the description and function characterization of a flange-on type low energy electron microscope are given. in this microscope a magnetic beam separator with 10 degrees deflection angle is used in order to facilitate compacting the instrument on a single 10 in. flange. meanwhile some correcting elements in the electron optical system are simplified to reduce the complexities of construction and operation. the sample is set close to ground potential, so that all the electrostatic lenses are easily to float at high voltages. the performance of the microscope in typical low energy electron microscopy, low energy electron diffraction and photoemission electron microscopy modes is demonstrated through several experiments. a lateral resolution of 51 nm is estimated for low energy electron microscopy imaging. with femtosecond laser as light source, the consequent nonlinear photoemission makes this microscope also suitable for the observation of optical near field phenomena and a lateral resolution of 110 nm is obtained. |
| WOS标题词 | science & technology ; physical sciences |
| 学科主题 | 物理化学 |
| 类目[WOS] | physics, atomic, molecular & chemical |
| 研究领域[WOS] | physics |
| 关键词[WOS] | multiphoton photoemission ; interface ; si(111) |
| 收录类别 | SCI |
| 语种 | 英语 |
| WOS记录号 | WOS:000324665200001 |
| 公开日期 | 2013-10-11 |
| 源URL | [http://159.226.238.44/handle/321008/117535]  |
| 专题 | 大连化学物理研究所_中国科学院大连化学物理研究所 |
| 作者单位 | 1.Chinese Acad Sci, Dalian Inst Chem Phys, Dalian 116023, Peoples R China 2.Dalian Jiaotong Univ, Dalian 116028, Peoples R China |
| 推荐引用方式 GB/T 7714 | Zhang, Guan-hua,Sun, Ju-long,Jin, Yan-ling,et al. A Compact Low Energy Electron Microscope for Surface Analysis[J]. chinese journal of chemical physics,2013,26(4):369-373. |
| APA | Zhang, Guan-hua,Sun, Ju-long,Jin, Yan-ling,Zang, Kan,Guo, Fang-zhun,&Yang, Xue-ming.(2013).A Compact Low Energy Electron Microscope for Surface Analysis.chinese journal of chemical physics,26(4),369-373. |
| MLA | Zhang, Guan-hua,et al."A Compact Low Energy Electron Microscope for Surface Analysis".chinese journal of chemical physics 26.4(2013):369-373. |
入库方式： OAI收割
来源：大连化学物理研究所
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