Investigation on vibration induced fretting in degraded contact interface
文献类型：期刊论文
| 作者 | Li, Qingya3,4,5; Gao, Jinchun4,5; Flowers, George T.2; Yi, Wei1; Jackson, Robert L.2; Hamilton, Michael6 |
| 刊名 | MICROELECTRONICS RELIABILITY
 |
| 出版日期 | 2022-12-01 |
| 卷号 | 139页码:10 |
| ISSN号 | 0026-2714 |
| 关键词 | Coaxial connector Contact surface failure Vibration induced fretting High frequency characteristic |
| DOI | 10.1016/j.microrel.2022.114794 |
| 通讯作者 | Gao, Jinchun(gjc@bupt.edu.cn) ; Flowers, George T.(flowegt@auburn.edu) |
| 英文摘要 | Connectors are widely used in electrical systems and are subject to a variety of degradation mechanisms that can negatively impact electrical performance. One major cause of degradation is vibration induced fretting. While there has been considerable work on the effects of general connector degradation and defects on high frequency characteristics, there has been little focused work that specifically considers effects of vibration induced fretting in actual coaxial connector systems.Accordingly, in the present work, a detailed study of an example coaxial connector with a degraded contact surface was conducted, and the effects on vibration induced fretting are characterized using the high frequency results considering the parameters of resistance, capacitance, and inductance. The contact degradation process caused by the fretting was investigated using theoretical analysis, software simulation, and experimental tests. Simulations were performed to evaluate the high frequency behavior within a frequency range of 0.1 MHz to 1.0 GHz. An experimental investigation was conducted to investigate the effect of degraded contact surfaces on high frequency characteristics and provide validation for the model results. The simulation results were consistent with the measured results for both fresh and degraded connectors. Compared to the fresh condition, the S11 parameters and S21 parameters of the first and second degradation levels increased and decreased, respectively. These results indicate that contact damage due to fretting in the sample system generally results in the deteri-oration of high frequency properties and signal integrity. |
| WOS关键词 | SURFACE-ROUGHNESS ; CONSTRICTION RESISTANCE ; MULTISCALE ANALYSIS ; PERFORMANCE ; CONNECTORS |
| 资助项目 | National Natural Science Foundation of China ; NSF Center for Advanced Vehicle and Extreme Environment Electronics, Auburn University ; [51877010] |
| WOS研究方向 | Engineering ; Science & Technology - Other Topics ; Physics |
| 语种 | 英语 |
| 出版者 | PERGAMON-ELSEVIER SCIENCE LTD |
| WOS记录号 | WOS:000872566400001 |
| 资助机构 | National Natural Science Foundation of China ; NSF Center for Advanced Vehicle and Extreme Environment Electronics, Auburn University |
| 源URL | [http://ir.ia.ac.cn/handle/173211/50511]  |
| 专题 | 国家专用集成电路设计工程技术研究中心_信号处理及脑机接口芯片 |
| 通讯作者 | Gao, Jinchun; Flowers, George T. |
| 作者单位 | 1.Auburn Univ, Dept Mat Engn, Auburn, AL 36849 USA 2.Auburn Univ, Dept Mech Engn, Auburn, AL 36849 USA 3.Chinese Acad Sci, Inst Automat, Beijing 100190, Peoples R China 4.Beijing Univ Posts & Telecommun, Beijing Key Lab Work Safety Intelligent Monitoring, Beijing 100876, Peoples R China 5.Beijing Univ Posts & Telecommun, Sch Elect Engn, Beijing 100876, Peoples R China 6.Auburn Univ, Dept Elect & Comp Engn, Auburn, AL 36849 USA |
| 推荐引用方式 GB/T 7714 | Li, Qingya,Gao, Jinchun,Flowers, George T.,et al. Investigation on vibration induced fretting in degraded contact interface[J]. MICROELECTRONICS RELIABILITY,2022,139:10. |
| APA | Li, Qingya,Gao, Jinchun,Flowers, George T.,Yi, Wei,Jackson, Robert L.,&Hamilton, Michael.(2022).Investigation on vibration induced fretting in degraded contact interface.MICROELECTRONICS RELIABILITY,139,10. |
| MLA | Li, Qingya,et al."Investigation on vibration induced fretting in degraded contact interface".MICROELECTRONICS RELIABILITY 139(2022):10. |
入库方式： OAI收割
来源：自动化研究所
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