中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Design on Thin Wire of Wire Burn Test for the High Voltage Power Supply Breakdown

文献类型:期刊论文

作者Jiang, Li4; Wang, Liangfu1,4; Wu, Peng2,3; Zhang, Jie2,3; Huang, Ya4; Xu, Xuesong2,3; Huang, Zhengyi2,3; Chen, Qiangjian2,3
刊名IEEE TRANSACTIONS ON PLASMA SCIENCE
出版日期2022-05-27
ISSN号0093-3813
关键词Wires Klystrons Power supplies Snubbers Plasma temperature Reliability Resistance Crowbar high-voltage power supply klystron snubber wire burn
DOI10.1109/TPS.2022.3176363
通讯作者Wu, Peng(wupeng@ipp.ac.cn)
英文摘要The short-circuit protection device (snubber or crowbar) of high-voltage power supply can absorb or bypass the energy fed by the power supply when the klystron sparks and protects the klystron. The reliability test of the snubber and crowbar becomes an urgent demand. This article presents a simple method to test the reliability of snubber and crowbar, in which a thin wire is adopted to replace the klystron and simulate its sparking characteristics. When sparking occurs, the thin wire will fuse if the energy fed to it is over 6 J when the effect of snubber or crowbar is included. This article mainly focuses on how to design such a thin wire for the wire burn test. At first, a theoretical model is proposed to design the wire which can just stand 6 J energy. Then, this method is verified by simulation. At last, experimental test is performed, and the validity of the method proposed in this article is verified. It indicates that the thin wire is effective in simulating the sparking characteristics of the klystron, and it can be used in the reliability test of the klystron.
WOS关键词PERFORMANCE ; CROWBAR
资助项目Comprehensive Research Facility for Fusion Technology Program of China[2018000052-73-01-001228]
WOS研究方向Physics
语种英语
出版者IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
WOS记录号WOS:000805800400001
资助机构Comprehensive Research Facility for Fusion Technology Program of China
源URL[http://ir.hfcas.ac.cn:8080/handle/334002/131185]  
专题中国科学院合肥物质科学研究院
通讯作者Wu, Peng
作者单位1.Univ Sci & Technol China, Hefei 230026, Peoples R China
2.Hefei KeJuGao Technol Co Ltd, Hefei, Peoples R China
3.Chinese Acad Sci, Hefei Inst Phys Sci, Hefei 230031, Peoples R China
4.Chinese Acad Sci, Hefei Inst Phys Sci, Hefei 230031, Peoples R China
推荐引用方式
GB/T 7714
Jiang, Li,Wang, Liangfu,Wu, Peng,et al. Design on Thin Wire of Wire Burn Test for the High Voltage Power Supply Breakdown[J]. IEEE TRANSACTIONS ON PLASMA SCIENCE,2022.
APA Jiang, Li.,Wang, Liangfu.,Wu, Peng.,Zhang, Jie.,Huang, Ya.,...&Chen, Qiangjian.(2022).Design on Thin Wire of Wire Burn Test for the High Voltage Power Supply Breakdown.IEEE TRANSACTIONS ON PLASMA SCIENCE.
MLA Jiang, Li,et al."Design on Thin Wire of Wire Burn Test for the High Voltage Power Supply Breakdown".IEEE TRANSACTIONS ON PLASMA SCIENCE (2022).

入库方式: OAI收割

来源:合肥物质科学研究院

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