Edge effect removal in Fourier ptychographic microscopy via periodic plus smooth image decomposition
文献类型:期刊论文
作者 | Pan, An3,4; Wang, Aiye1,3,4; Zheng, Junfu2; Gao, Yuting1,3,4; Ma, Caiwen1,3,4; Yao, Baoli3,4 |
刊名 | OPTICS AND LASERS IN ENGINEERING |
出版日期 | 2023-03 |
卷号 | 162 |
ISSN号 | 0143-8166;1873-0302 |
关键词 | Fourier ptychographic microscopy Computational optical imaging Edge effect Fast Fourier transform |
DOI | 10.1016/j.optlaseng.2022.107408 |
产权排序 | 1 |
英文摘要 | Fourier ptychographic microscopy (FPM) is a promising computational imaging technique with high resolution, wide field-of-view (FOV) and quantitative phase recovery. So far, a series of system errors that may corrupt the image quality of FPM has been reported. However, an imperceptible artifact caused by edge effect caught our attention and may also degrade the precision of phase imaging in FPM with a cross-shape artifact in the Fourier space. We found that the precision of reconstructed phase at the same subregion depends on the different sizes of block processing as a result of different edge conditions, which limits the quantitative phase measurements via FPM. And this artifact is caused by the aperiodic image extension of fast Fourier transform (FFT). Herein, to remove the edge effect and improve the accuracy, two classes of opposite algorithms termed discrete cosine transform (DCT) and periodic plus smooth image decomposition (PPSID) were reported respectively and discussed systematically. Although both approaches can remove the artifacts in FPM and may be extended to other Fourier analysis techniques, PPSID-FPM has a comparable efficiency to conventional FPM algorithm. The PPSID-FPM algorithm improves the standard deviation of phase accuracy as a factor of 4 from 0.08 radians to 0.02 radians. Finally, we summarized and discussed all the reported system errors of FPM within a generalized model. |
语种 | 英语 |
出版者 | ELSEVIER SCI LTD |
WOS记录号 | WOS:000899357200005 |
源URL | [http://ir.opt.ac.cn/handle/181661/96285] |
专题 | 西安光学精密机械研究所_瞬态光学技术国家重点实验室 |
通讯作者 | Pan, An; Yao, Baoli |
作者单位 | 1.Chinese Acad Sci, Key Lab Space Precis Measurement Technol, Xian 710119, Peoples R China 2.Univ Rochester, Inst Opt, Rochester, NY 14627 USA 3.Univ Chinese Acad Sci, Beijing 100049, Peoples R China 4.Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Photon, Xian 710119, Peoples R China |
推荐引用方式 GB/T 7714 | Pan, An,Wang, Aiye,Zheng, Junfu,et al. Edge effect removal in Fourier ptychographic microscopy via periodic plus smooth image decomposition[J]. OPTICS AND LASERS IN ENGINEERING,2023,162. |
APA | Pan, An,Wang, Aiye,Zheng, Junfu,Gao, Yuting,Ma, Caiwen,&Yao, Baoli.(2023).Edge effect removal in Fourier ptychographic microscopy via periodic plus smooth image decomposition.OPTICS AND LASERS IN ENGINEERING,162. |
MLA | Pan, An,et al."Edge effect removal in Fourier ptychographic microscopy via periodic plus smooth image decomposition".OPTICS AND LASERS IN ENGINEERING 162(2023). |
入库方式: OAI收割
来源:西安光学精密机械研究所
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