中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Edge effect removal in Fourier ptychographic microscopy via periodic plus smooth image decomposition

文献类型:期刊论文

作者Pan, An3,4; Wang, Aiye1,3,4; Zheng, Junfu2; Gao, Yuting1,3,4; Ma, Caiwen1,3,4; Yao, Baoli3,4
刊名OPTICS AND LASERS IN ENGINEERING
出版日期2023-03
卷号162
ISSN号0143-8166;1873-0302
关键词Fourier ptychographic microscopy Computational optical imaging Edge effect Fast Fourier transform
DOI10.1016/j.optlaseng.2022.107408
产权排序1
英文摘要

Fourier ptychographic microscopy (FPM) is a promising computational imaging technique with high resolution, wide field-of-view (FOV) and quantitative phase recovery. So far, a series of system errors that may corrupt the image quality of FPM has been reported. However, an imperceptible artifact caused by edge effect caught our attention and may also degrade the precision of phase imaging in FPM with a cross-shape artifact in the Fourier space. We found that the precision of reconstructed phase at the same subregion depends on the different sizes of block processing as a result of different edge conditions, which limits the quantitative phase measurements via FPM. And this artifact is caused by the aperiodic image extension of fast Fourier transform (FFT). Herein, to remove the edge effect and improve the accuracy, two classes of opposite algorithms termed discrete cosine transform (DCT) and periodic plus smooth image decomposition (PPSID) were reported respectively and discussed systematically. Although both approaches can remove the artifacts in FPM and may be extended to other Fourier analysis techniques, PPSID-FPM has a comparable efficiency to conventional FPM algorithm. The PPSID-FPM algorithm improves the standard deviation of phase accuracy as a factor of 4 from 0.08 radians to 0.02 radians. Finally, we summarized and discussed all the reported system errors of FPM within a generalized model.

语种英语
出版者ELSEVIER SCI LTD
WOS记录号WOS:000899357200005
源URL[http://ir.opt.ac.cn/handle/181661/96285]  
专题西安光学精密机械研究所_瞬态光学技术国家重点实验室
通讯作者Pan, An; Yao, Baoli
作者单位1.Chinese Acad Sci, Key Lab Space Precis Measurement Technol, Xian 710119, Peoples R China
2.Univ Rochester, Inst Opt, Rochester, NY 14627 USA
3.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
4.Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Photon, Xian 710119, Peoples R China
推荐引用方式
GB/T 7714
Pan, An,Wang, Aiye,Zheng, Junfu,et al. Edge effect removal in Fourier ptychographic microscopy via periodic plus smooth image decomposition[J]. OPTICS AND LASERS IN ENGINEERING,2023,162.
APA Pan, An,Wang, Aiye,Zheng, Junfu,Gao, Yuting,Ma, Caiwen,&Yao, Baoli.(2023).Edge effect removal in Fourier ptychographic microscopy via periodic plus smooth image decomposition.OPTICS AND LASERS IN ENGINEERING,162.
MLA Pan, An,et al."Edge effect removal in Fourier ptychographic microscopy via periodic plus smooth image decomposition".OPTICS AND LASERS IN ENGINEERING 162(2023).

入库方式: OAI收割

来源:西安光学精密机械研究所

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