Analysis and Design of Fault Prediction and Health Assessment System for the optoelectronic Equipment
文献类型：会议论文
| 作者 | Zhang, Chuming2; Wei, Guojun2; Wang, Xuan1; Cao, Yu1; Xie, Meilin1 |
| 出版日期 | 2022 |
| 会议日期 | 2022-12-16 |
| 会议地点 | Chongqing, China |
| 关键词 | optoelectronic equipment Fault prediction Health assessment statistical analysis |
| DOI | 10.1109/IMCEC55388.2022.10019826 |
| 页码 | 891-895 |
| 英文摘要 | In recent years, due to the rise of emerging technologies such as integrated circuits, artificial intelligence and big data, Optical measurement equipment performance is also constantly improving, more and more new technology, new processes, new materials continue to appear. Therefore, the maintenance of the optoelectronic equipment is also much more difficult. Based on these problems, this paper investigates the application of fault prediction and health management in optoelectronic devices. The main analysis and design of the system failure prediction and health assessment, and in response to the needs of optoelectronic devices for the life analysis, health status determination, fault prediction alarms, etc, designed a failure prediction and health assessment system for optoelectronic devices. © 2022 IEEE. |
| 产权排序 | 2 |
| 会议录 | IMCEC 2022 - IEEE 5th Advanced Information Management, Communicates, Electronic and Automation Control Conference
 |
| 会议录出版者 | Institute of Electrical and Electronics Engineers Inc. |
| 语种 | 英语 |
| ISBN号 | 9781665479677 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/96357]  |
| 专题 | 西安光学精密机械研究所_光电测量技术实验室 |
| 作者单位 | 1.Xi'An Institute of Optics and Precision Mechanics of CAS, Xi'an; 710119, China 2.Space Engineering University, China; |
| 推荐引用方式 GB/T 7714 | Zhang, Chuming,Wei, Guojun,Wang, Xuan,et al. Analysis and Design of Fault Prediction and Health Assessment System for the optoelectronic Equipment[C]. 见:. Chongqing, China. 2022-12-16. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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