中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Electrical treeing failure in silicone gel insulation for encapsulation under high frequency bipolar square-wave voltage

文献类型:期刊论文

作者Zhang, Chuang2; Wang, Shihang2; Chen, Zhen1; Zhang, Haoran2; Zha, Xiaopeng2; Zhou, Fusheng2; Li, Jianying2; Li, Shengtao2
刊名ENGINEERING FAILURE ANALYSIS
出版日期2023-06
卷号148
关键词Bipolar square-wave voltage Silicone gel Electrical tree Encapsulating insulation
ISSN号1350-6307;1873-1961
DOI10.1016/j.engfailanal.2023.107092
产权排序2
英文摘要

Silicone gel insulation has been widely used in power electronic devices, serving as the encap-sulation material. Its dielectric strength under high-frequency voltage determines the reliable operation of the devices. Electrical tree is a typical failure of solid insulating materials, and the electrical tree propagation in silicone gel under bipolar square-wave voltage are investigated in this paper. The results show that electrical trees are pearl-line like, bush-like and bubble-like under varied voltage conditions. After the rapid growth period, the electrical trees stagnate under frequency lower than 20 kHz while develop steadily when the voltage frequency is higher than 25 kHz. The number of tree branch, fractal dimension and accumulated damage increase with the voltage frequency. In comparison, the electrical trees propagate slowly under sinusoidal -wave voltage. The partial discharge and photo-degradation corresponding to the fluorescence are found in main tree channel, which are related to voltage waveform and lead to different electrical tree behavior. The injection and transportation of space charge accelerates the electrical tree propagation, especially at the rising/falling edge of bipolar square-wave field due to polarity reversal. Besides, the amorphous carbon deposited near the needle tip and the bubbles in tree channels filled with hydrogen and carbon monoxide are all related with the electrical tree propagation.

语种英语
WOS记录号WOS:000954384000001
出版者PERGAMON-ELSEVIER SCIENCE LTD
源URL[http://ir.opt.ac.cn/handle/181661/96413]  
专题空间科学微光探测技术研究室
通讯作者Wang, Shihang; Li, Jianying
作者单位1.Chinese Acad Sci, Xian Inst Opt & Precis Mech, Xian 710049, Shaanxi, Peoples R China
2.Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Shaanxi, Peoples R China
推荐引用方式
GB/T 7714
Zhang, Chuang,Wang, Shihang,Chen, Zhen,et al. Electrical treeing failure in silicone gel insulation for encapsulation under high frequency bipolar square-wave voltage[J]. ENGINEERING FAILURE ANALYSIS,2023,148.
APA Zhang, Chuang.,Wang, Shihang.,Chen, Zhen.,Zhang, Haoran.,Zha, Xiaopeng.,...&Li, Shengtao.(2023).Electrical treeing failure in silicone gel insulation for encapsulation under high frequency bipolar square-wave voltage.ENGINEERING FAILURE ANALYSIS,148.
MLA Zhang, Chuang,et al."Electrical treeing failure in silicone gel insulation for encapsulation under high frequency bipolar square-wave voltage".ENGINEERING FAILURE ANALYSIS 148(2023).

入库方式: OAI收割

来源:西安光学精密机械研究所

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