Electrical treeing failure in silicone gel insulation for encapsulation under high frequency bipolar square-wave voltage
文献类型:期刊论文
作者 | Zhang, Chuang2; Wang, Shihang2; Chen, Zhen1; Zhang, Haoran2; Zha, Xiaopeng2; Zhou, Fusheng2; Li, Jianying2; Li, Shengtao2 |
刊名 | ENGINEERING FAILURE ANALYSIS
![]() |
出版日期 | 2023-06 |
卷号 | 148 |
关键词 | Bipolar square-wave voltage Silicone gel Electrical tree Encapsulating insulation |
ISSN号 | 1350-6307;1873-1961 |
DOI | 10.1016/j.engfailanal.2023.107092 |
产权排序 | 2 |
英文摘要 | Silicone gel insulation has been widely used in power electronic devices, serving as the encap-sulation material. Its dielectric strength under high-frequency voltage determines the reliable operation of the devices. Electrical tree is a typical failure of solid insulating materials, and the electrical tree propagation in silicone gel under bipolar square-wave voltage are investigated in this paper. The results show that electrical trees are pearl-line like, bush-like and bubble-like under varied voltage conditions. After the rapid growth period, the electrical trees stagnate under frequency lower than 20 kHz while develop steadily when the voltage frequency is higher than 25 kHz. The number of tree branch, fractal dimension and accumulated damage increase with the voltage frequency. In comparison, the electrical trees propagate slowly under sinusoidal -wave voltage. The partial discharge and photo-degradation corresponding to the fluorescence are found in main tree channel, which are related to voltage waveform and lead to different electrical tree behavior. The injection and transportation of space charge accelerates the electrical tree propagation, especially at the rising/falling edge of bipolar square-wave field due to polarity reversal. Besides, the amorphous carbon deposited near the needle tip and the bubbles in tree channels filled with hydrogen and carbon monoxide are all related with the electrical tree propagation. |
语种 | 英语 |
WOS记录号 | WOS:000954384000001 |
出版者 | PERGAMON-ELSEVIER SCIENCE LTD |
源URL | [http://ir.opt.ac.cn/handle/181661/96413] ![]() |
专题 | 空间科学微光探测技术研究室 |
通讯作者 | Wang, Shihang; Li, Jianying |
作者单位 | 1.Chinese Acad Sci, Xian Inst Opt & Precis Mech, Xian 710049, Shaanxi, Peoples R China 2.Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Shaanxi, Peoples R China |
推荐引用方式 GB/T 7714 | Zhang, Chuang,Wang, Shihang,Chen, Zhen,et al. Electrical treeing failure in silicone gel insulation for encapsulation under high frequency bipolar square-wave voltage[J]. ENGINEERING FAILURE ANALYSIS,2023,148. |
APA | Zhang, Chuang.,Wang, Shihang.,Chen, Zhen.,Zhang, Haoran.,Zha, Xiaopeng.,...&Li, Shengtao.(2023).Electrical treeing failure in silicone gel insulation for encapsulation under high frequency bipolar square-wave voltage.ENGINEERING FAILURE ANALYSIS,148. |
MLA | Zhang, Chuang,et al."Electrical treeing failure in silicone gel insulation for encapsulation under high frequency bipolar square-wave voltage".ENGINEERING FAILURE ANALYSIS 148(2023). |
入库方式: OAI收割
来源:西安光学精密机械研究所
其他版本
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。