Axial Resolution Enhancement of Optical Sectioning Structured Illumination Microscopy Based on Three-Beam Interference
文献类型:期刊论文
作者 | Xiao, Chao2,3; Li, Xing2,3; Qian, Jia3; Ma, Wang2,3; Min, Junwei2,3; Gao, Peng1; Dan, Dan2,3; Yao, Baoli2,3 |
刊名 | PHOTONICS |
出版日期 | 2023-06 |
卷号 | 10期号:6 |
ISSN号 | 2304-6732 |
关键词 | structured illumination microscopy optical sectioning three-beam interference axial resolution 3D microscopy |
DOI | 10.3390/photonics10060682 |
产权排序 | 1 |
英文摘要 | As a branch of 3D microscopy, optical sectioning structured illumination microscopy (OS-SIM) has the advantages of fast imaging speed, weak photobleaching and phototoxicity, and flexible and compatible configuration. Although the method of using the one-dimensional periodic fringe pattern projected on the sample can remove the out-of-focus background from the in-focus signal, the axial resolution of the final reconstructed 3D image is not improved. Here, we propose a three-beam interference OS-SIM, namely TBOS, instead of the common-used dual-beam interference OS-SIM (DBOS). The three-beam interference scheme has been adopted in 3D super-resolution SIM (3D-SR-SIM), where the fringe phase shifting needs to be along each of the three orientations. In contrast, TBOS applies phase shifting only in one arbitrary direction. We built a TBOS SIM microscope and performed the 3D imaging experiments with 46 nm diameter fluorescent microspheres and a mouse kidney section. The axial resolution of the 3D image obtained with TBOS was enhanced by a factor of 1.36 compared to the DBOS method, consistent with the theoretical analysis and simulation. The OS-SIM with enhanced axial resolution for 3D imaging may find a wide range of applications in the biomedical field. |
语种 | 英语 |
出版者 | MDPI |
WOS记录号 | WOS:001015776900001 |
源URL | [http://ir.opt.ac.cn/handle/181661/96554] |
专题 | 西安光学精密机械研究所_瞬态光学技术国家重点实验室 |
通讯作者 | Dan, Dan; Yao, Baoli |
作者单位 | 1.Xidian Univ, Sch Phys, Xian 710071, Peoples R China 2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China 3.Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Photon, Xian 710119, Peoples R China |
推荐引用方式 GB/T 7714 | Xiao, Chao,Li, Xing,Qian, Jia,et al. Axial Resolution Enhancement of Optical Sectioning Structured Illumination Microscopy Based on Three-Beam Interference[J]. PHOTONICS,2023,10(6). |
APA | Xiao, Chao.,Li, Xing.,Qian, Jia.,Ma, Wang.,Min, Junwei.,...&Yao, Baoli.(2023).Axial Resolution Enhancement of Optical Sectioning Structured Illumination Microscopy Based on Three-Beam Interference.PHOTONICS,10(6). |
MLA | Xiao, Chao,et al."Axial Resolution Enhancement of Optical Sectioning Structured Illumination Microscopy Based on Three-Beam Interference".PHOTONICS 10.6(2023). |
入库方式: OAI收割
来源:西安光学精密机械研究所
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