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  4. 瞬态光学技术国家重点实验室
VCSEL Cavity Loss and Gain Measurement for High-Speed Optical Interconnects

文献类型：期刊论文

作者Wang, Binhao3,4; Sorin, Wayne V.2; Tan, Michael R. T.1
刊名JOURNAL OF LIGHTWAVE TECHNOLOGY
出版日期2023-08-15
卷号41期号:16页码:5418-5424
关键词Vertical-cavity surface-emitting lasers optical interconnects
ISSN号0733-8724;1558-2213
DOI10.1109/JLT.2023.3262193
产权排序1
英文摘要

Over 100 Gb/s Four-level Pulse-Amplitude Modulation (PAM4) Vertical-Cavity Surface-Emitting Laser (VCSEL) based optical interconnects require high speed, damped, and low relative intensity noise (RIN) VCSELs. Measurement techniques for intrinsic parameters are essential for optimizing VCSEL designs. The proposed VCSEL cavity round-trip loss and gain coefficient measurement provides the insight of VCSEL distributed Bragg reflectors (DBRs) and quantum well (QW) design. A simple VCSEL cavity model is described and excellent matching between the model and measurement is achieved.

语种英语
WOS记录号WOS:001040120900026
出版者IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
源URL[http://ir.opt.ac.cn/handle/181661/96704]  
专题西安光学精密机械研究所_瞬态光学技术国家重点实验室
通讯作者Wang, Binhao
作者单位1.Lumentum, San Jose, CA 95131 USA
2.Hewlett Packard Enterprise, Hewlett Packard Labs, Milpitas, CA 95035 USA
3.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
4.Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Photon, Xian 710119, Peoples R China
推荐引用方式
GB/T 7714		 Wang, Binhao,Sorin, Wayne V.,Tan, Michael R. T.. VCSEL Cavity Loss and Gain Measurement for High-Speed Optical Interconnects[J]. JOURNAL OF LIGHTWAVE TECHNOLOGY,2023,41(16):5418-5424.
APA Wang, Binhao,Sorin, Wayne V.,&Tan, Michael R. T..(2023).VCSEL Cavity Loss and Gain Measurement for High-Speed Optical Interconnects.JOURNAL OF LIGHTWAVE TECHNOLOGY,41(16),5418-5424.
MLA Wang, Binhao,et al."VCSEL Cavity Loss and Gain Measurement for High-Speed Optical Interconnects".JOURNAL OF LIGHTWAVE TECHNOLOGY 41.16(2023):5418-5424.

入库方式： OAI收割

来源：西安光学精密机械研究所

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