中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Hybrid Ga2O3/AlGaN/GaN Ultraviolet Detector With Gate Metal in the Grooved AlGaN Layer for Obtaining Low Dark Current and Large Detectivity

文献类型:期刊论文

作者Z. P. Liu; C. S. Chu; B. X. Wang; G. S. Huang; K. Jiang; Y. H. Zhang; X. J. Sun; Z. H. Zhang and D. B. Li
刊名Ieee Transactions on Electron Devices
出版日期2022
卷号69期号:11页码:6166-6170
ISSN号0018-9383
DOI10.1109/ted.2022.3206186
英文摘要In this work, a metal/Ga2O3/AlGaN/GaN hybrid-structured metal-semiconductor-metal ultraviolet photodetector (MSM UV PD) with low dark current has been proposed and fabricated. In the dark condition, the depletion region formed by the metal gate and the AlGaN layer pinches off the two-dimensional electron gas (2DEG) channel, and we can obtain a dark current even lower than 10(-10) A/cm(2). In the illumination condition, due to the electric field formed by the metal and the Ga2O3 layer, the photogenerated electrons will move to the AlGaN/GaN channel to form the 2DEG. We then get a photo-to-dark current ratio of 8.77 x 10(8). Furthermore, the detectivity of the device is higher than 3.30 x 10(12) Jones when a 254-nm UV illumination signal is applied.
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语种英语
源URL[http://ir.ciomp.ac.cn/handle/181722/66735]  
专题中国科学院长春光学精密机械与物理研究所
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Z. P. Liu,C. S. Chu,B. X. Wang,et al. Hybrid Ga2O3/AlGaN/GaN Ultraviolet Detector With Gate Metal in the Grooved AlGaN Layer for Obtaining Low Dark Current and Large Detectivity[J]. Ieee Transactions on Electron Devices,2022,69(11):6166-6170.
APA Z. P. Liu.,C. S. Chu.,B. X. Wang.,G. S. Huang.,K. Jiang.,...&Z. H. Zhang and D. B. Li.(2022).Hybrid Ga2O3/AlGaN/GaN Ultraviolet Detector With Gate Metal in the Grooved AlGaN Layer for Obtaining Low Dark Current and Large Detectivity.Ieee Transactions on Electron Devices,69(11),6166-6170.
MLA Z. P. Liu,et al."Hybrid Ga2O3/AlGaN/GaN Ultraviolet Detector With Gate Metal in the Grooved AlGaN Layer for Obtaining Low Dark Current and Large Detectivity".Ieee Transactions on Electron Devices 69.11(2022):6166-6170.

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来源:长春光学精密机械与物理研究所

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