中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Space-based correction method for LED array misalignment in Fourier ptychographic microscopy

文献类型:期刊论文

作者Y. Q. Zhu; M. L. Sun; P. L. Wu; Q. Q. Mu; L. Xuan; D. Y. Li and B. Wang
刊名Optics Communications
出版日期2022
卷号514页码:7
ISSN号0030-4018
DOI10.1016/j.optcom.2022.128163
英文摘要Fourier ptychographic microscopy is a super-resolution technique, which could break through the Space-Band Product (SBP) limit of the system by employing varied-illumination and phase retrieval algorithm. A LED array is used to provide angularly varying illuminations, which is portable and cheap. However, the installation accuracy of the LED array is not sufficient, resulting in position misalignment errors. The misalignment errors not only cause the calculation error of the sub-apertures in the frequency domain, but also the artifacts in reconstruction images. Although some correction methods have been proposed, the correction ability of these methods cannot deal with the misalignment errors well. In this paper, we proposed a misalignment errors correction method. This method uses the Particle swarm optimization (PSO) algorithm to search the four misalignment parameters (delta x, delta y, theta, delta h) in space domain. It is termed as Space based correction (SBC) method. Compared with the state-of-art methods, the SBC method is more stable and accuracy.& nbsp;
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语种英语
源URL[http://ir.ciomp.ac.cn/handle/181722/67098]  
专题中国科学院长春光学精密机械与物理研究所
推荐引用方式
GB/T 7714
Y. Q. Zhu,M. L. Sun,P. L. Wu,et al. Space-based correction method for LED array misalignment in Fourier ptychographic microscopy[J]. Optics Communications,2022,514:7.
APA Y. Q. Zhu,M. L. Sun,P. L. Wu,Q. Q. Mu,L. Xuan,&D. Y. Li and B. Wang.(2022).Space-based correction method for LED array misalignment in Fourier ptychographic microscopy.Optics Communications,514,7.
MLA Y. Q. Zhu,et al."Space-based correction method for LED array misalignment in Fourier ptychographic microscopy".Optics Communications 514(2022):7.

入库方式: OAI收割

来源:长春光学精密机械与物理研究所

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