Wavelength tuning robustness optimization for a high-temperature single-mode VCSEL used in chip-scale atomic sensing systems
文献类型：期刊论文
| 作者 | Y. Zhou; X. Zhang; J. Zhang; J. Cui; Y. Ning; Y. Zeng and L. Wang |
| 刊名 | Applied Optics
 |
| 出版日期 | 2022 |
| 卷号 | 61期号:9页码:2417-2423 |
| ISSN号 | 1559128X |
| DOI | 10.1364/AO.450782 |
| 英文摘要 | In this paper, the wavelength current tuning characteristics of high-temperature-operation single-mode verticalcavity surface-emitting lasers (VCSELs) for chip-scale atomic sensing systems are studied. Excellent wavelength current tuning robustness is helpful to improve the stability of atomic sensing systems. By optimizing the size of the oxide aperture combined with surface relief mode control technology, the single-mode VCSEL with an 8 m oxide aperture can achieve 2.02 mW output power at 355 K, and the wavelength current tuning coefficient is ~0.25 nm/mA. This excellent wavelength current tuning robustness results from the low active current density and device heat generation due to the optimized oxide aperture size. 2022 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement. |
| URL标识 | 查看原文 |
| 源URL | [http://ir.ciomp.ac.cn/handle/181722/67241]  |
| 专题 | 中国科学院长春光学精密机械与物理研究所 |
| 推荐引用方式 GB/T 7714 | Y. Zhou,X. Zhang,J. Zhang,et al. Wavelength tuning robustness optimization for a high-temperature single-mode VCSEL used in chip-scale atomic sensing systems[J]. Applied Optics,2022,61(9):2417-2423. |
| APA | Y. Zhou,X. Zhang,J. Zhang,J. Cui,Y. Ning,&Y. Zeng and L. Wang.(2022).Wavelength tuning robustness optimization for a high-temperature single-mode VCSEL used in chip-scale atomic sensing systems.Applied Optics,61(9),2417-2423. |
| MLA | Y. Zhou,et al."Wavelength tuning robustness optimization for a high-temperature single-mode VCSEL used in chip-scale atomic sensing systems".Applied Optics 61.9(2022):2417-2423. |
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