Capture the early stage of shear banding for bulk metallic glass sheet for MEMS applications
文献类型：期刊论文
| 作者 | Li, Diao-Feng; Li, Nan; Bai, Chun-Guang; Zhang, Zhi-Qiang; Zhao, Jian; Yang, Rui |
| 刊名 | MEASUREMENT
 |
| 出版日期 | 2022-10-01 |
| 卷号 | 202页码:10 |
| ISSN号 | 0263-2241 |
| 关键词 | Bulk metallic glasses Bending proof strength Permanent strain MEMS |
| DOI | 10.1016/j.measurement.2022.111816 |
| 通讯作者 | Bai, Chun-Guang(cgbai@imr.ac.cn) |
| 英文摘要 | Bulk metallic glasses (BMGs) are a class of promising candidate materials which applied in Micro-electromechanical Systems (MEMS). However, a suitable mechanical parameter and an effective measurement approach are still lacked to characterize the onset of plastic deformation exactly for BMG sheets in bending. In this work, bending proof strength with permanent strain at the level of 0.005% (sigma(P,0.005%)) was proposed to represent the exactly onset of yielding for BMG sheets. This mechanical parameter was measured by a series of stepwise cyclic loading-unloading tests, which are particular suitable for timely capture the earlier stage of shear banding for BMG sheets within MEMS scale, thus showing the significant superiorities to monotonic loading test and conventional cyclic tests which needed to be equipped with the deflectometers. The sigma(P,0.005%) of Zr61Ti2C-u(25)Al(12) (ZT1) BMG sheet with thickness of 100 mu m was determined to be 1900+10 MPa, and physically cor-relates to the propagation stress of embryonic shear band instead of the nucleation stress. In addition, a quantitative correlation between permanent strain and shear offsets on BMG sheet surface has established, thus the permanent strain of thinner BMG sheets can be attained by a simple approach, and without relying on the conventional contact-type deflectometers with high accuracy. The sigma(P,0.005%) can be used as a more reliable and rational design parameter for thinner BMG sheets which applied in MEMS fields. |
| 资助项目 | National Key Research and Development Program of China[2017YFB0306201] |
| WOS研究方向 | Engineering ; Instruments & Instrumentation |
| 语种 | 英语 |
| 出版者 | ELSEVIER SCI LTD |
| WOS记录号 | WOS:000890173400005 |
| 资助机构 | National Key Research and Development Program of China |
| 源URL | [http://ir.imr.ac.cn/handle/321006/176046]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 通讯作者 | Bai, Chun-Guang |
| 作者单位 | Chinese Acad Sci, Shichangxu Innovat Ctr Adv Mat, Inst Met Res, 72 Wenhua Rd, Shenyang 110016, Peoples R China |
| 推荐引用方式 GB/T 7714 | Li, Diao-Feng,Li, Nan,Bai, Chun-Guang,et al. Capture the early stage of shear banding for bulk metallic glass sheet for MEMS applications[J]. MEASUREMENT,2022,202:10. |
| APA | Li, Diao-Feng,Li, Nan,Bai, Chun-Guang,Zhang, Zhi-Qiang,Zhao, Jian,&Yang, Rui.(2022).Capture the early stage of shear banding for bulk metallic glass sheet for MEMS applications.MEASUREMENT,202,10. |
| MLA | Li, Diao-Feng,et al."Capture the early stage of shear banding for bulk metallic glass sheet for MEMS applications".MEASUREMENT 202(2022):10. |
入库方式： OAI收割
来源：金属研究所
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