Microstructure and physical properties of epsilon-Fe2O3 thin films fabricated by pulsed laser deposition
文献类型：期刊论文
| 作者 | Chen, Shanshan1,2; Jiang, Yixiao1,2; Yao, Tingting1,2; Tao, Ang1,2; Yan, Xuexi1,2; Liu, Fang1; Chen, Chunlin1,2; Ma, Xiuliang1,3; Ye, Hengqiang2 |
| 刊名 | MICRON
 |
| 出版日期 | 2022-12-01 |
| 卷号 | 163页码:6 |
| ISSN号 | 0968-4328 |
| 关键词 | epsilon-Fe2O3 Thin film Pulsed laser deposition Transmission electron microscopy Physical properties |
| DOI | 10.1016/j.micron.2022.103359 |
| 通讯作者 | Chen, Chunlin(clchen@imr.ac.cn) |
| 英文摘要 | epsilon-Fe2O3 has attracted intense interest in the field of magnetoelectric materials due to its promising physical properties. The epitaxial growth of epsilon-Fe2O3 thin films is challenging since it is a metastable phase of iron oxide. In this study, epsilon-Fe2O3 (001) thin films are epitaxially grown on SrTiO3 (111) substrates by pulsed laser deposition (PLD). The crystal structure, valence state, and microstructure of the epsilon-Fe2O3 thin films are investigated by X-ray diffraction, X-ray photoelectron spectroscopy, and transmission electron microscopy. It is revealed that the oxygen pressure, deposition and annealing temperatures, and laser beam energy affect significantly the epitaxial growth of epsilon-Fe2O3 thin films. The orientation relationship between films and substrates is epsilon-Fe2O3 (001)[010] // SrTiO3 (111)[(1) over bar 10]. The magnetic hysteresis loops tested by a superconducting quantum interference device and UV-Vis reflection spectra suggest that the epsilon-Fe2O3 thin film with thickness of similar to 20 nm has a strong magnetic anisotropy, a coercivity of 600 Oe, and an indirect band gap of 3.26 eV. |
| 资助项目 | National Natural Science Founda- tion of China ; Key Research Program of Frontier Sciences, CAS ; CAS Interdisciplinary Innovation Team ; Basic and Applied Basic Research Major Programme of Guangdong Province, China ; [52125101] ; [51971224] ; [51801215] ; [QYZDY-SSW-JSC027] ; [292020000008] ; [2021B0301030003] ; [X210141TL210] |
| WOS研究方向 | Microscopy |
| 语种 | 英语 |
| 出版者 | PERGAMON-ELSEVIER SCIENCE LTD |
| WOS记录号 | WOS:000872930400001 |
| 资助机构 | National Natural Science Founda- tion of China ; Key Research Program of Frontier Sciences, CAS ; CAS Interdisciplinary Innovation Team ; Basic and Applied Basic Research Major Programme of Guangdong Province, China |
| 源URL | [http://ir.imr.ac.cn/handle/321006/176397]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 通讯作者 | Chen, Chunlin |
| 作者单位 | 1.Univ Sci & Technol China, Inst Met Res, Chinese Acad Sci, Sch Mat Sci & Engn,Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China 2.Ji Hua Lab, Foshan 528200, Peoples R China 3.Lanzhou Univ Technol, State Key Lab Adv Proc & Recycling Nonferrous Met, Lanzhou 730050, Peoples R China |
| 推荐引用方式 GB/T 7714 | Chen, Shanshan,Jiang, Yixiao,Yao, Tingting,et al. Microstructure and physical properties of epsilon-Fe2O3 thin films fabricated by pulsed laser deposition[J]. MICRON,2022,163:6. |
| APA | Chen, Shanshan.,Jiang, Yixiao.,Yao, Tingting.,Tao, Ang.,Yan, Xuexi.,...&Ye, Hengqiang.(2022).Microstructure and physical properties of epsilon-Fe2O3 thin films fabricated by pulsed laser deposition.MICRON,163,6. |
| MLA | Chen, Shanshan,et al."Microstructure and physical properties of epsilon-Fe2O3 thin films fabricated by pulsed laser deposition".MICRON 163(2022):6. |
入库方式： OAI收割
来源：金属研究所
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