中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Blind deep-learning based preprocessing method for Fourier ptychographic microscopy

文献类型:期刊论文

AuthorWu, Kai1,2; Pan, An2; Sun, Zhonghan2; Shi, Yinxia1,2; Gao, Wei2
SourceOptics and Laser Technology
Issued Date2024-02
Volume169
ISSN00303992
KeywordFourier ptychographic microscopy Noise modeling Blind denoising Deep learning
DOI10.1016/j.optlastec.2023.110140
Rank1
English Abstract

Fourier ptychographic microscopy (FPM) is a technique for tackling the trade-off between the resolution and the imaging field of view by combining the techniques from aperture synthesis and phase retrieval to estimate the complex object from a series of low-resolution intensity images captured under angle-varied illumination. The captured images are commonly corrupted by multiple noise, leading to the degradation of the reconstructed image quality. Typically speaking, the noise model and noise level of the experimental images are unknown, and the traditional image denoising methods have limited effect. In this paper we model the FPM forward imaging process corrupted by noise and divide the noise in the captured images into two parts: the signal-dependent part and the signal-independent part. Based on the noise model we propose a novel blind deep-learning based Fourier ptychographic microscopy preprocessing method, termed BDFP, for removing these two components of noise. First, from a portion of the captured low-resolution images, a set of blocks corresponding to the smooth area of the object are extracted to model signal-independent noise. Second, under the assumption that the signal-dependent noise follows a Poisson distribution, we add Poisson noise and signal-independent noise blocks to clean images to form a paired training dataset, which is then used for training a deep convolutional neural network (CNN) model to reduce both signal-dependent noise and signal-independent noise. The proposed blind preprocessing method, combining with typical FPM reconstruction algorithms, is tested on simulated data and experimental images. Experimental results show that our preprocessing method can significantly reduce the noise in the captured images and bring about effective improvements in reconstructed image quality. © 2023 Elsevier Ltd

Language英语
PublisherElsevier Ltd
源URL[http://ir.opt.ac.cn/handle/181661/96824]  
Collection西安光学精密机械研究所_瞬态光学技术国家重点实验室
Corresponding AuthorPan, An
Affiliation1.University of Chinese Academy of Sciences, Beijing; 100049, China
2.Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an; 710119, China;
Recommended Citation
GB/T 7714
Wu, Kai,Pan, An,Sun, Zhonghan,et al. Blind deep-learning based preprocessing method for Fourier ptychographic microscopy[J]. Optics and Laser Technology,2024,169.
APA Wu, Kai,Pan, An,Sun, Zhonghan,Shi, Yinxia,&Gao, Wei.(2024).Blind deep-learning based preprocessing method for Fourier ptychographic microscopy.Optics and Laser Technology,169.
MLA Wu, Kai,et al."Blind deep-learning based preprocessing method for Fourier ptychographic microscopy".Optics and Laser Technology 169(2024).

入库方式: OAI收割

来源:西安光学精密机械研究所

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