Single Line of Sight Frame Camera Based on the Radoptic Effect of Ultrafast Semiconductor Detector
文献类型：预印本
| 作者 | Liu, Yiheng2,3,4; He, Kai4 ; Yan, Xin4; Gao, Guilong4; Du, Wanyi4; Shang, Yang4; Wang, Gang4; Wang, Tao4; Zhang, Jun1; Tian, Jinshou2,4
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| 英文摘要 | A new optical beam splitting method is proposed, based on which the optical frame camera capable of capturing multiple frames in a single exposure is designed and experimentally verified. The operation of the frame camera is based on an ultra-fast response semiconductor detector. It is equipped with an optical beam splitter and an optical imaging module. The ultrafast semiconductor detector receives an optical pulse that produces a transient refractive index change, and ultrafast physical processes are recorded by diffracting the probe laser through the transient phase grating. The interaction of an X-ray pulse with a semiconductor detector to produce a phase grating is simulated, based on the Monte Carlo method. The optical beam splitting mode separates a laser into two optical pulses with a certain time difference in the direction of polarization perpendicular to each other. The imaging module filters the diffracted probe laser in the spectral plane and then images multiple frames. The frame camera was used to record the temporal and spatial distribution characteristics of femtosecond laser pulses with a temporal resolution of 4.1 ps. This frame camera has great potential and value for applying to experimental studies of inertial confinement fusion. © 2023, The Authors. All rights reserved. |
| 出处 | SSRN |
| 出版者 | SSRN |
| ISSN号 | 15565068 |
| 发表日期 | 2023 |
| 语种 | 英语 |
| 产权排序 | 1 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/96861]  |
| 专题 | 条纹相机工程中心 |
| 作者单位 | 1.National University of Defense Technology, College of Electronic Science, Hunan, Changsha; 410073, China 2.Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan; 030006, China 3.University of Chinese Academy of Sciences, Beijing; 100049, China 4.Key Laboratory of Ultra-fast photoelectric Diagnostics Technology, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an; 710119, China |
| 推荐引用方式 GB/T 7714 | Liu, Yiheng,He, Kai,Yan, Xin,et al. Single Line of Sight Frame Camera Based on the Radoptic Effect of Ultrafast Semiconductor Detector. 2023. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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