Towards a Characterization of Vulnerability of XCR4C ASIC on Heavy-Ion Induced Transient Events
文献类型：期刊论文
| 作者 | Li, B; Lu, B ; Jia, H; Chen, Y; Zhang, FY; Su, ZX; Gao, JT; Wang, CL; Zhao, WX; Liu, HN
|
| 刊名 | 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
 |
| 出版日期 | 2022 |
| 页码 | 156-159 |
| 关键词 | X-ray CCD CDS Micro latch-up Feedback SET SEL |
| DOI | 10.1109/RADECS47380.2019.9745654 |
| 文献子类 | Proceedings Paper |
| 英文摘要 | Transients with durations of dozens of seconds in a rad-hard four-channel CDS ASIC (XCR4C) for X-ray CCD were observed during Ta-181(31+) ions irradiation and were attributed to the complementary feedback mechanism in the bias circuit. |
| 会议地点 | Montpellier, FRANCE |
| 会议日期 | SEP 16-20, 2019 |
| 语种 | 英语 |
| WOS记录号 | WOS:000848160100033 |
| ISBN号 | 978-1-7281-5699-6 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/300596]  |
| 专题 | 高能物理研究所_粒子天体物理中心 高能物理研究所_实验物理中心 |
| 作者单位 | 中国科学院高能物理研究所 |
| 推荐引用方式 GB/T 7714 | Li, B,Lu, B,Jia, H,et al. Towards a Characterization of Vulnerability of XCR4C ASIC on Heavy-Ion Induced Transient Events[J]. 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS),2022:156-159. |
| APA | Li, B.,Lu, B.,Jia, H.,Chen, Y.,Zhang, FY.,...&Liu, HN.(2022).Towards a Characterization of Vulnerability of XCR4C ASIC on Heavy-Ion Induced Transient Events.19th European Conference on Radiation and Its Effects on Components and Systems (RADECS),156-159. |
| MLA | Li, B,et al."Towards a Characterization of Vulnerability of XCR4C ASIC on Heavy-Ion Induced Transient Events".19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (2022):156-159. |
入库方式： OAI收割
来源：高能物理研究所
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