基于X射线近场散斑的波前检测技术研究现状
文献类型：期刊论文
| 作者 | Li, Fan,; Kang, Le,; Yang, Fugui ; Yao, Chunxia; Zhu, Peiping; Li, Ming; Sheng, Weifan
|
| 刊名 | 光学学报
 |
| 出版日期 | 2022 |
| 卷号 | 42期号:8页码:800002 |
| ISSN号 | 02532239 |
| DOI | 10.3788/AOS202242.0800002 |
| 文献子类 | Article |
| 英文摘要 | The fourth generation synchrotron radiation light source provides X-rays with higher brightness and coherence,and better performance for many research fields. To access the full potential of these beams, accurate beamline alignment and high-quality X-ray optics are required. Wavefront metrology plays an important role in these aspects. X-ray near-field speckle based wavefront metrology, which has been developed rapidly in the past 10 years, has the advantages of simplicity and high measurement accuracy. Based on the property of not changing in shape and size of the speckle in the deep Fresnel region, the cross-correlation between the reference image and the sample image is calculated, and the wavefront information of the incident wave, the transmitted wave or the reflected wave of the optics to be measured is extracted. The present research status of X-ray near-field speckle based wavefront metrology is summarized. The principles, experimental procedures, advantages and applications of X-ray speckle tracking, X-ray speckle vector tracking, X-ray speckle scanning, self-correlation X-ray speckle scanning, unified modulated pattern analysis and Ptychographic X-ray speckle tracking are introduced. © 2022, Chinese Lasers Press. All right reserved. |
| 语种 | 中文 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/300442]  |
| 专题 | 高能物理研究所_东莞分部 高能物理研究所_多学科研究中心 |
| 作者单位 | 中国科学院高能物理研究所 |
| 推荐引用方式 GB/T 7714 | Li, Fan,,Kang, Le,,Yang, Fugui,等. 基于X射线近场散斑的波前检测技术研究现状[J]. 光学学报,2022,42(8):800002. |
| APA | Li, Fan,.,Kang, Le,.,Yang, Fugui.,Yao, Chunxia.,Zhu, Peiping.,...&Sheng, Weifan.(2022).基于X射线近场散斑的波前检测技术研究现状.光学学报,42(8),800002. |
| MLA | Li, Fan,,et al."基于X射线近场散斑的波前检测技术研究现状".光学学报 42.8(2022):800002. |
入库方式： OAI收割
来源：高能物理研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。