Damage threshold influenced by the high absorption defect at the film–substrate interface under ultraviolet laser irradiation
文献类型：期刊论文
| 作者 | Yu ZK(于振坤) ; Hongbo He ; Wei Sun ; Hongji Qi ; Minghong Yang ; Qiling Xiao ; Meiping Zhu |
| 刊名 | Optics letters
 |
| 出版日期 | 2013 |
| 期号 | 21 |
| 收录类别 | SCI |
| 公开日期 | 2013-10-18 |
| 源URL | [http://ir.siom.ac.cn/handle/181231/11373]  |
| 专题 | 上海光学精密机械研究所_中科院强激光材料重点实验室 |
| 推荐引用方式 GB/T 7714 | Yu ZK,Hongbo He,Wei Sun,et al. Damage threshold influenced by the high absorption defect at the film–substrate interface under ultraviolet laser irradiation[J]. Optics letters,2013(21). |
| APA | 于振坤.,Hongbo He.,Wei Sun.,Hongji Qi.,Minghong Yang.,...&Meiping Zhu.(2013).Damage threshold influenced by the high absorption defect at the film–substrate interface under ultraviolet laser irradiation.Optics letters(21). |
| MLA | 于振坤,et al."Damage threshold influenced by the high absorption defect at the film–substrate interface under ultraviolet laser irradiation".Optics letters .21(2013). |
入库方式： OAI收割
来源：上海光学精密机械研究所
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