A truncated test scheme design method for success-failure in-orbit tests
文献类型:期刊论文
作者 | Ding, Wenzhe1,2; Bai, Xiang2; Wang, Qingwei2; Long, Fang2; Li, Hailin2; Wu, Zhengrong2; Liu, Jian2; Yao, Huisheng2; Yang, Hong2 |
刊名 | Reliability Engineering and System Safety |
出版日期 | 2024-03 |
卷号 | 243 |
ISSN号 | 09518320 |
关键词 | IOT verification test Sequential test Bayesian theory Risk calculation Optimization |
DOI | 10.1016/j.ress.2023.109782 |
产权排序 | 1 |
英文摘要 | Based on the success-failure test feature of in-orbit tests (IOTs) for typical space equipment, this paper presents a method for designing a truncated test scheme for success-failure in-orbit tests. With this method, a small upper boundary of the sample size for the IOT verification test can be obtained before the test starts. The method introduces the truncated Bayes-sequential mesh test (SMT) method into the design of the IOT verification test scheme and greatly compresses the continuous test area by incorporating optimization theory, resulting in a smaller upper limit of the IOT sample size. First, this paper derives a specific calculation formula for the Bayes-SMT critical line. Second, the Markov chain model is adopted to calculate the occurrence probabilities of each acceptance and rejection point through state transition. Finally, an optimal truncated test optimization algorithm based on the augmented lagrangian genetic algorithm is proposed. Simulation tests show that, compared with the classical single sampling method, the truncated sequential probability ratio test method, the truncated SMT method, and the truncated Bayes-SMT method based on step-by-step calculation, the method presented in this paper can be used to obtain a sequential test scheme with smaller truncated sample size. © 2023 |
语种 | 英语 |
出版者 | Elsevier Ltd |
源URL | [http://ir.opt.ac.cn/handle/181661/97026] |
专题 | 西安光学精密机械研究所_光电测量技术实验室 |
通讯作者 | Bai, Xiang |
作者单位 | 1.Xi'an Institute of Optics and Precision Mechanics of CAS, Xi'an; 710119, China 2.Beijing Institute of Tracking and Telecommunications Technology, Beijing, 100096, China; |
推荐引用方式 GB/T 7714 | Ding, Wenzhe,Bai, Xiang,Wang, Qingwei,et al. A truncated test scheme design method for success-failure in-orbit tests[J]. Reliability Engineering and System Safety,2024,243. |
APA | Ding, Wenzhe.,Bai, Xiang.,Wang, Qingwei.,Long, Fang.,Li, Hailin.,...&Yang, Hong.(2024).A truncated test scheme design method for success-failure in-orbit tests.Reliability Engineering and System Safety,243. |
MLA | Ding, Wenzhe,et al."A truncated test scheme design method for success-failure in-orbit tests".Reliability Engineering and System Safety 243(2024). |
入库方式: OAI收割
来源:西安光学精密机械研究所
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