Fault tolerance on-chip:a reliable computing paradigm using self-test,self-diagnosis,and self-repair (3S)approach
文献类型：期刊论文
| 作者 | Xiaowei LI2; Guihai YAN2; Jing YE2; Ying WANG2 |
| 刊名 | 中国科学:信息科学(英文版)
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| 出版日期 | 2018 |
| 卷号 | 61.0期号:011页码:112102 |
| 关键词 | fault tolerance on-chip self-test self-diagnosis self-repair |
| ISSN号 | 1674-733X |
| 英文摘要 | If your computer crashes,you can revive it by a reboot,an empirical solution that usually turns out to be effective.The rationale behind this solution is that transient faults,either in hardware or software, can be fixed by refreshing the machine state.Such a "silver bullet",however,could be futile in the future because the faults,especially those existing in the hardware such as Integrated Circuit (IC)chips,cannot be eliminated by refreshing.What we need is a more sophisticated mechanism to steer the system back to the right track.The "magic cure"is the Fault Tolerance On-Chip (FTOC)mechanism,which relies on a suite of built-in design-for-reliability logic,including fault detection,fault diagnosis,and error recovery,working in a self-supportive manner.We have exploited the FTOC to build a holistic solution ranging from on-chip fault detection to error recovery mechanisms to address faults caused by chips progressively aging.Besides fault detection,the FTOC paradigm provides attractive benefits,such as facilitating graceful performance degradation,mitigating the impact of verification blind spots,and improving the chip yield. |
| 语种 | 英语 |
| 源URL | [http://119.78.100.204/handle/2XEOYT63/34853]  |
| 专题 | 中国科学院计算技术研究所期刊论文_中文 |
| 作者单位 | 1.中国科学院大学 2.State Key Laboratory of Computer Architecture,Institute of Computing Technology,Chinese Academy of Sciences |
| 推荐引用方式 GB/T 7714 | Xiaowei LI,Guihai YAN,Jing YE,et al. Fault tolerance on-chip:a reliable computing paradigm using self-test,self-diagnosis,and self-repair (3S)approach[J]. 中国科学:信息科学(英文版),2018,61.0(011):112102. |
| APA | Xiaowei LI,Guihai YAN,Jing YE,&Ying WANG.(2018).Fault tolerance on-chip:a reliable computing paradigm using self-test,self-diagnosis,and self-repair (3S)approach.中国科学:信息科学(英文版),61.0(011),112102. |
| MLA | Xiaowei LI,et al."Fault tolerance on-chip:a reliable computing paradigm using self-test,self-diagnosis,and self-repair (3S)approach".中国科学:信息科学(英文版) 61.0.011(2018):112102. |
入库方式： OAI收割
来源：计算技术研究所
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