A Triple-Stage Robust Ellipse Fitting Algorithm Based on Outlier Removal
文献类型:期刊论文
作者 | Long, Chenrong8; Hu, Qinglei6,7,8; Zhao, Mingyang5; Li, Dongyu3,4; Ouyang, Zhenchao6,8; Yan, Dong-Ming1,2![]() |
刊名 | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
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出版日期 | 2023 |
卷号 | 72页码:14 |
关键词 | Ellipse fitting linear clustering outlier removal probability density spacecraft pose measurement |
ISSN号 | 0018-9456 |
DOI | 10.1109/TIM.2023.3325872 |
通讯作者 | Hu, Qinglei(huql_buaa@buaa.edu.cn) |
英文摘要 | Ellipse fitting is a fundamental yet critical task in computer vision, and the development of robust and accurate algorithms is crucial for various applications. In this study, we propose a triple-stage robust ellipse fitting algorithm to address the challenges posed by noise and outliers in the input data. Specifically, to overcome the sensitivity of existing methods to outliers, we introduce an adaptive outlier removal (AOR) algorithm. This algorithm dynamically removes outliers based on the probability density of all data points, eliminating the need for manual parameter adjustment and enhancing robustness to outliers. Furthermore, we tackle the issue of multiple ellipses in the input data by projecting the filtered points into the polar coordinate system. The points are then divided into equal intervals based on the polar angle, facilitating linear clustering to identify the point sets belonging to candidate ellipses, which helps to avoid erroneous fits and improve accuracy. Finally, to avoid solving the geometric distance between the point and the quadratic curve, a simplified ellipse fitting objective function and its corresponding optimization scheme are developed, in which the ellipse parameters are iteratively solved. To verify the universality and accuracy of the algorithm, we tested it on both synthetic data and real-world images from various scenarios with state-of-the-art approaches. Additionally, experiments have been carried out on a physical spacecraft pose measurement platform. The experimental results demonstrate that the algorithm exhibits excellent performance in terms of fitting accuracy and robustness, with a position estimation error of less than 2 mm and an attitude estimation error of less than 0.1(degrees). |
WOS关键词 | CURVES ; IMAGES ; CIRCLE ; EDGE |
资助项目 | National Natural Science Foundation of China[62227812] ; National Natural Science Foundation of China[61960206011] ; Natural Science Foundation of Zhejiang Province[LD22E050004] ; Tianmushan Laboratory Research Project[TK-2023-B-010] ; Tianmushan Laboratory Research Project[TK-2023-C-020] ; Foundation of Science and Technology on Space Intelligent Control Laboratory[HTKJ2022KL502008] |
WOS研究方向 | Engineering ; Instruments & Instrumentation |
语种 | 英语 |
WOS记录号 | WOS:001097160000030 |
出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
资助机构 | National Natural Science Foundation of China ; Natural Science Foundation of Zhejiang Province ; Tianmushan Laboratory Research Project ; Foundation of Science and Technology on Space Intelligent Control Laboratory |
源URL | [http://ir.ia.ac.cn/handle/173211/54463] ![]() |
专题 | 多模态人工智能系统全国重点实验室 |
通讯作者 | Hu, Qinglei |
作者单位 | 1.Univ Chinese Acad Sci, Sch AI, Beijing 100190, Peoples R China 2.Chinese Acad Sci, Inst Automat, Natl Lab Pattern Recognit NLPR, Beijing 100190, Peoples R China 3.Shanghai Inst Satellite Engn, Shanghai 201109, Peoples R China 4.Beihang Univ, Sch Cyber Sci & Technol, Beijing 100191, Peoples R China 5.Chinese Acad Sci, Beijing Acad Artificial Intelligence BAAI, Beijing, Peoples R China 6.Beihang Univ, Zhongfa Aviat Inst, Hangzhou 311115, Peoples R China 7.Tian mushan Lab, Hangzhou 310023, Peoples R China 8.Beihang Univ, Sch Automat Sci & Elect Engn, Beijing 100191, Peoples R China |
推荐引用方式 GB/T 7714 | Long, Chenrong,Hu, Qinglei,Zhao, Mingyang,et al. A Triple-Stage Robust Ellipse Fitting Algorithm Based on Outlier Removal[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,2023,72:14. |
APA | Long, Chenrong,Hu, Qinglei,Zhao, Mingyang,Li, Dongyu,Ouyang, Zhenchao,&Yan, Dong-Ming.(2023).A Triple-Stage Robust Ellipse Fitting Algorithm Based on Outlier Removal.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,72,14. |
MLA | Long, Chenrong,et al."A Triple-Stage Robust Ellipse Fitting Algorithm Based on Outlier Removal".IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 72(2023):14. |
入库方式: OAI收割
来源:自动化研究所
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