Redundant information model for Fourier ptychographic microscopy
文献类型：期刊论文
| 作者 | Gao, Huiqin3,4,5; Pan, An3,5; Gao, Yuting3,5; Zhang, Yu2,5; Wan, Quanzhen1,5; Mu, Tingkui4; Yao, Baoli3,5
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| 刊名 | Optics Express
 |
| 出版日期 | 2023-12-18 |
| 卷号 | 31期号:26页码:42822-42837 |
| ISSN号 | 10944087 |
| DOI | 10.1364/OE.505407 |
| 产权排序 | 1 |
| 英文摘要 | Fourier ptychographic microscopy (FPM) is a computational optical imaging technique that overcomes the traditional trade-off between resolution and field of view (FOV) by exploiting abundant redundant information in both spatial and frequency domains for high-quality image reconstruction. However, the redundant information in FPM remains ambiguous or abstract, which presents challenges to further enhance imaging capabilities and deepen our understanding of the FPM technique. Inspired by Shannon’s information theory and extensive experimental experience in FPM, we defined the specimen complexity and reconstruction algorithm utilization rate and reported a model of redundant information for FPM to predict reconstruction results and guide the optimization of imaging parameters. The model has been validated through extensive simulations and experiments. In addition, it provides a useful tool to evaluate different algorithms, revealing a utilization rate of 24%±1% for the Gauss-Newton algorithm, LED Multiplexing, Wavelength Multiplexing, EPRY-FPM, and GS. In contrast, mPIE exhibits a lower utilization rate of 19%±1%. © 2023 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement. |
| 语种 | 英语 |
| 出版者 | Optica Publishing Group (formerly OSA) |
| 源URL | [http://ir.opt.ac.cn/handle/181661/97085]  |
| 专题 | 西安光学精密机械研究所_瞬态光学技术国家重点实验室 |
| 作者单位 | 1.School of Electronics and Information Technology, Sun Yat-Sen University, Guangzhou; 510275, China 2.Division of Advanced Manufacturing, Shenzhen International Graduate School, Tsinghua University, Shenzhen; 518055, China; 3.University of Chinese Academy of Sciences, Beijing; 100049, China; 4.MOE Key Laboratory for Nonequilibrium Synthesis and Modulation of Condensed Matter, Research Center for Space Optics and Astronomy, School of Physics, Xi’an Jiaotong University, Xi’an; 710049, China; 5.State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an; 710119, China; |
| 推荐引用方式 GB/T 7714 | Gao, Huiqin,Pan, An,Gao, Yuting,et al. Redundant information model for Fourier ptychographic microscopy[J]. Optics Express,2023,31(26):42822-42837. |
| APA | Gao, Huiqin.,Pan, An.,Gao, Yuting.,Zhang, Yu.,Wan, Quanzhen.,...&Yao, Baoli.(2023).Redundant information model for Fourier ptychographic microscopy.Optics Express,31(26),42822-42837. |
| MLA | Gao, Huiqin,et al."Redundant information model for Fourier ptychographic microscopy".Optics Express 31.26(2023):42822-42837. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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