Analysis of geological glasses by electron probe microanalysis under low beam current density conditions
文献类型：期刊论文
| 作者 | Zhu, Ji-Hao1; Chu, Feng-You1; Jochum, Klaus Peter6; Zhan, Xiu-Chun2; Ding, Xing5; Wu, Bin4; Lu, Jiang-Gu; Li, Yun-Xiu1; Dong, Yan-Hui; Liu, Ji-Qiang |
| 刊名 | JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
 |
| 出版日期 | 2023-10-04 |
| 卷号 | 38期号:10页码:2188-2202 |
| ISSN号 | 0267-9477 |
| DOI | 10.1039/d3ja00183k |
| 英文摘要 | Precise and accurate determination of major components in alkali silicate glasses provides critical information concerning element distribution, petrogenesis and magmatic evolution. However, as one of the most important in situ microanalytical technologies, the application of electron probe microanalysis (EPMA) was limited by the time-dependent loss of X-ray intensity of alkali ions (especially Na) during electron beam bombardment on alkali silicate glasses. In this study, an optimized analytical method was developed using a JEOL JXA 8100 EPMA, aiming to get a long enough incubation duration suitable for accurate analysis of major element mass fractions. The optimal analytical conditions were determined as follows: 15 kV accelerating voltage, 2 nA beam current, 20 mu m beam diameter, 40 s peak counting time, Na and K analyzed with top priority, time-saving mode with no additional detector movement and no peak search functioned. The availability of this low beam current density condition (6.37 x 10(-3) nA mu m(-2)) to 24 anhydrous reference glasses, with their compositions covering the entire spectrum from the ultramafic to highly siliceous range, was verified by the good agreement of the EPMA measured data with their GeoReM preferred values. Similarly, the methodology presented here is also suitable for analysis of hydrous glasses with H2O contents up to approximately 9 wt%, accompanied by no obvious Na loss found and no complicated mathematical corrections needed, and therefore can be used for the estimation of H2O contents in H2O-rich (>1 wt%) geological glasses by the difference method. Despite its analytical accuracy and precision (>0.5 wt%) not better than those of SIMS and FTIR, EPMA can be used as a substitute technique for H2O determination with its main advantages of excellent spatial resolution (down to 5-10 mu m) and analytical convenience, especially for small melt inclusions or tiny experimental quench products, and the case with no appropriate calibration standards or no reported extinction coefficients available for those compositions of interest. In daily application, our optimized method is low cost and easy to implement and can achieve comparable precision and detection limits with acceptable efficiency (similar to 4-5 min/point for ten major elements) relative to routine analysis conditions. |
| WOS关键词 | PLASMA-MASS SPECTROMETRY ; NIST SRM 610 ; SILICATE-GLASSES ; QUANTITATIVE-ANALYSIS ; MICROPROBE ANALYSIS ; VOLCANIC GLASSES ; TRACE-ELEMENTS ; WATER ; CALIBRATION ; H2O |
| 资助项目 | This study was financially supported by the National Natural Science Foundation of China (No. 41106051) and Scientific Research Fund of the Second Institute of Oceanography, MNR, grant no. JT1504. |
| WOS研究方向 | Chemistry ; Spectroscopy |
| 语种 | 英语 |
| 出版者 | ROYAL SOC CHEMISTRY |
| WOS记录号 | WOS:001074468300001 |
| 资助机构 | This study was financially supported by the National Natural Science Foundation of China (No. 41106051) and Scientific Research Fund of the Second Institute of Oceanography, MNR, grant no. JT1504. ; This study was financially supported by the National Natural Science Foundation of China (No. 41106051) and Scientific Research Fund of the Second Institute of Oceanography, MNR, grant no. JT1504. ; This study was financially supported by the National Natural Science Foundation of China (No. 41106051) and Scientific Research Fund of the Second Institute of Oceanography, MNR, grant no. JT1504. ; This study was financially supported by the National Natural Science Foundation of China (No. 41106051) and Scientific Research Fund of the Second Institute of Oceanography, MNR, grant no. JT1504. ; This study was financially supported by the National Natural Science Foundation of China (No. 41106051) and Scientific Research Fund of the Second Institute of Oceanography, MNR, grant no. JT1504. ; This study was financially supported by the National Natural Science Foundation of China (No. 41106051) and Scientific Research Fund of the Second Institute of Oceanography, MNR, grant no. JT1504. ; This study was financially supported by the National Natural Science Foundation of China (No. 41106051) and Scientific Research Fund of the Second Institute of Oceanography, MNR, grant no. JT1504. ; This study was financially supported by the National Natural Science Foundation of China (No. 41106051) and Scientific Research Fund of the Second Institute of Oceanography, MNR, grant no. JT1504. |
| 源URL | [http://ir.iggcas.ac.cn/handle/132A11/110792]  |
| 专题 | 地质与地球物理研究所_岩石圈演化国家重点实验室 |
| 通讯作者 | Zhu, Ji-Hao |
| 作者单位 | 1.Minist Nat Resources, Inst Oceanog 2, Hangzhou 310012, Peoples R China 2.Natl Res Ctr Geoanal, Beijing 100037, Peoples R China 3.Chinese Acad Sci, Inst Geol & Geophys, Beijing 100029, Peoples R China 4.East China Univ Technol, Nanchang 330013, Jiangxi, Peoples R China 5.Chinese Acad Sci, Guangzhou Inst Geochem, Guangzhou, Peoples R China 6.Max Planck Inst Chem, POB 3060, D-55020 Mainz, Germany |
| 推荐引用方式 GB/T 7714 | Zhu, Ji-Hao,Chu, Feng-You,Jochum, Klaus Peter,et al. Analysis of geological glasses by electron probe microanalysis under low beam current density conditions[J]. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY,2023,38(10):2188-2202. |
| APA | Zhu, Ji-Hao.,Chu, Feng-You.,Jochum, Klaus Peter.,Zhan, Xiu-Chun.,Ding, Xing.,...&Wu, Shi-Tou.(2023).Analysis of geological glasses by electron probe microanalysis under low beam current density conditions.JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY,38(10),2188-2202. |
| MLA | Zhu, Ji-Hao,et al."Analysis of geological glasses by electron probe microanalysis under low beam current density conditions".JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY 38.10(2023):2188-2202. |
入库方式： OAI收割
来源：地质与地球物理研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。