中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Study on tribological behavior of aC: H: Si: O film caused by temperature-induced friction interface evolution

文献类型:期刊论文

作者Pingmei Yin; Chenglong Mou; Wenbo Li; Xueqian Cao; Zhibin Lu; Guangan Zhang
刊名Tribology International
出版日期2023-05-15
期号186页码:108605
源URL[http://ir.licp.cn/handle/362003/30619]  
专题兰州化学物理研究所_固体润滑国家重点实验室
通讯作者Xueqian Cao; Guangan Zhang
推荐引用方式
GB/T 7714
Pingmei Yin,Chenglong Mou,Wenbo Li,et al. Study on tribological behavior of aC: H: Si: O film caused by temperature-induced friction interface evolution[J]. Tribology International,2023(186):108605.
APA Pingmei Yin,Chenglong Mou,Wenbo Li,Xueqian Cao,Zhibin Lu,&Guangan Zhang.(2023).Study on tribological behavior of aC: H: Si: O film caused by temperature-induced friction interface evolution.Tribology International(186),108605.
MLA Pingmei Yin,et al."Study on tribological behavior of aC: H: Si: O film caused by temperature-induced friction interface evolution".Tribology International .186(2023):108605.

入库方式: OAI收割

来源:兰州化学物理研究所

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