中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Deep Industrial Image Anomaly Detection: A Survey

文献类型:期刊论文

作者Jiaqi Liu4
刊名Machine Intelligence Research
出版日期2024
卷号21期号:1页码:104-135
ISSN号2731-538X
关键词Image anomaly detection, defect detection, industrial manufacturing, deep learning, computer vision
DOI10.1007/s11633-023-1459-z
英文摘要The recent rapid development of deep learning has laid a milestone in industrial image anomaly detection (IAD). In this paper, we provide a comprehensive review of deep learning-based image anomaly detection techniques, from the perspectives of neural network architectures, levels of supervision, loss functions, metrics and datasets. In addition, we extract the promising setting from industrial manufacturing and review the current IAD approaches under our proposed setting. Moreover, we highlight several opening challenges for image anomaly detection. The merits and downsides of representative network architectures under varying supervision are discussed. Finally, we summarize the research findings and point out future research directions. More resources are available at https://github.com/M-3LAB/awesome-industrial-anomaly-detection.
源URL[http://ir.ia.ac.cn/handle/173211/54578]  
专题自动化研究所_学术期刊_International Journal of Automation and Computing
作者单位1.NICE Group, Bielefeld University, Bielefeld 33619, Germany
2.Youtu Lab, Tencent, Shanghai 200233, China
3.NICE Group, University of Surrey, Guildford GU2 7YX, UK
4.Research Institute of Trustworthy Autonomous Systems, Southern University of Science and Technology, Shenzhen 518055, China
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Jiaqi Liu. Deep Industrial Image Anomaly Detection: A Survey[J]. Machine Intelligence Research,2024,21(1):104-135.
APA Jiaqi Liu.(2024).Deep Industrial Image Anomaly Detection: A Survey.Machine Intelligence Research,21(1),104-135.
MLA Jiaqi Liu."Deep Industrial Image Anomaly Detection: A Survey".Machine Intelligence Research 21.1(2024):104-135.

入库方式: OAI收割

来源:自动化研究所

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