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Novel methods for locating and matching IC cells based on standard cell libraries

文献类型：期刊论文

作者Liu, Can1,2; Wang, Kaige3; Li, Qing1; Zhao, Fazhan1; Zhao, Kun4; Ma, Hongtu4
刊名MICROELECTRONIC ENGINEERING
出版日期2024
卷号283页码:12
ISSN号0167-9317
关键词Reverse engineering Integrated circuits Scanning electron microscopy Image processing Hardware security
DOI10.1016/j.mee.2023.112107
通讯作者Liu, Can(canliu@whu.edu.cn) ; Li, Qing(liqing@ime.ac.cn)
英文摘要In the domain of hardware assurance, reverse engineering (RE) is essential for ensuring the security and reliability of integrated circuits (ICs). A potential approach in the crucial step of netlist extraction involves matching patterns in IC images to standard cell libraries. However, the morphological variations in images of cells and intra-cell similarities present significant challenges to effective matching. This paper introduces a new matching dataset of cells in Scanning Electron Microscopy (SEM) images and standard cells, including 579 SEM cells, two standard cell libraries, and 508 types of standard cells. Furthermore, we propose a novel matching method reliant on standard cell libraries. This method generates templates using the feature information of standard cells and conducts matching by comparing the similarity between the feature vector sets of an SEM cell and the templates, achieving a 100% accuracy rate on the matching dataset. Given that the matching method relies on accurate cell localization, we propose two methods of merging bounding boxes. These methods can convert the object detector's detection results on patches into localization results on the entire image, achieving 99.48% accuracy and 99.31% recall on the image of the matching dataset. Finally, We consolidate these methods into a comprehensive workflow for automating the extraction of cell information in large-scale IC images.
WOS关键词HARDWARE ; ALGORITHM ; NOISE
资助项目National Key Research and Development Program of China[2021YFB3100904]
WOS研究方向Engineering ; Science & Technology - Other Topics ; Optics ; Physics
语种英语
出版者ELSEVIER
WOS记录号WOS:001104106700001
资助机构National Key Research and Development Program of China
源URL[http://ir.ia.ac.cn/handle/173211/55207]  
专题脑图谱与类脑智能实验室
通讯作者Liu, Can; Li, Qing
作者单位1.Chinese Acad Sci IMECAS, Inst Microelect, Beijing, Peoples R China
2.Univ Chinese Acad Sci, Sch Integrated Circuits, Beijing 100020, Peoples R China
3.China Acad Aerosp Sci & Innovat, Beijing 100048, Peoples R China
4.Chinese Acad Sci, Inst Automat, Beijing 100190, Peoples R China
推荐引用方式
GB/T 7714		 Liu, Can,Wang, Kaige,Li, Qing,et al. Novel methods for locating and matching IC cells based on standard cell libraries[J]. MICROELECTRONIC ENGINEERING,2024,283:12.
APA Liu, Can,Wang, Kaige,Li, Qing,Zhao, Fazhan,Zhao, Kun,&Ma, Hongtu.(2024).Novel methods for locating and matching IC cells based on standard cell libraries.MICROELECTRONIC ENGINEERING,283,12.
MLA Liu, Can,et al."Novel methods for locating and matching IC cells based on standard cell libraries".MICROELECTRONIC ENGINEERING 283(2024):12.

入库方式： OAI收割

来源：自动化研究所

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