中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Effect of Mg35Sb65 interlayer on the thermal stability and scaling of Ge2Sb2Te5 phase change thin film

文献类型:期刊论文

作者Sun, Song;   Hu, Yifeng;   Lai, Tianshu;   Zhu, Xiaoqin
刊名JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
出版日期2021
卷号32期号:5页码:6408-6413
源URL[http://ir.semi.ac.cn/handle/172111/31498]  
专题半导体研究所_中科院半导体材料科学重点实验室
推荐引用方式
GB/T 7714
Sun, Song; Hu, Yifeng; Lai, Tianshu; Zhu, Xiaoqin. Effect of Mg35Sb65 interlayer on the thermal stability and scaling of Ge2Sb2Te5 phase change thin film[J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,2021,32(5):6408-6413.
APA Sun, Song; Hu, Yifeng; Lai, Tianshu; Zhu, Xiaoqin.(2021).Effect of Mg35Sb65 interlayer on the thermal stability and scaling of Ge2Sb2Te5 phase change thin film.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,32(5),6408-6413.
MLA Sun, Song; Hu, Yifeng; Lai, Tianshu; Zhu, Xiaoqin."Effect of Mg35Sb65 interlayer on the thermal stability and scaling of Ge2Sb2Te5 phase change thin film".JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 32.5(2021):6408-6413.

入库方式: OAI收割

来源:半导体研究所

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