FPM-WSI: Fourier ptychographic whole slide imaging via feature-domain backdiffraction
文献类型：预印本
| 作者 | Zhang, Shuhe2,3,4; Wang, Aiye1,4; Xu, Jinghao1,4; Feng, Tianci1,4; Zhou, Jinhua2; Pan, An1,4 |
| 英文摘要 | Fourier ptychographic microscopy (FPM), characterized by high-throughput computational imaging, theoretically provides a cunning solution to the trade-off between spatial resolution and field of view (FOV), which has a promising prospect in the application of digital pathology. However, block reconstruction and then stitching has currently become an unavoidable procedure due to vignetting effects. The stitched image tends to present color inconsistency in different image segments, or even stitching artifacts. Consequently, the advantages of FPM are not as pronounced when compared to the conventional scanning-and-stitching schemes widely employed in whole slide imaging (WSI) systems. This obstacle significantly impedes the profound advancement and practical implementation of FPM, explaining why, despite a decade of development, FPM has not gained widespread recognition in the field of biomedicine. In response, we reported a computational framework based on feature-domain backdiffraction to realize full-FOV, stitching-free FPM reconstruction. Different from conventional algorithms that establish the loss function in the image domain, our method formulates it in the feature domain, where effective information of images is extracted by a feature extractor to bypass the vignetting effect. The feature-domain error between predicted images based on estimation of model parameters and practically captured images is then digitally diffracted back through the optical system for complex amplitude reconstruction and aberration compensation. Through massive simulations and experiments, the method presents effective elimination of vignetting artifacts, and reduces the requirement of precise knowledge of illumination positions. We also found its great potential to recover the data with a lower overlapping rate of spectrum and to realize automatic blind-digital refocusing without a prior defocus distance. Furthermore, to the best of our knowledge, we firstly demonstrated application of FPM on a WSI system, termed FPM-WSI. This platform enables full-color, high-throughput imaging (4.7 mm diameter FOV, 336 nm half-pitch resolution with blue channel illumination) without blocking-and-stitching procedures for a batch of 4 slides. The platform also possesses autofocusing, shifting and regional recognition of slides that are completed by additional automatic mechanical hardware, and the acquisition time for a single slide is less than 4 s. In addition, we provide a user-friendly operation interface to facilitate the workflow, and alternative colorization schemes to choose from. The impact of the reported platform, with advantages of high-quality, high-speed imaging and low cost, will be far-reaching and desired in many fields of biomedical research, as well as in clinical applications. © 2024, CC BY-NC-SA. |
| 出处 | arXiv |
| ISSN号 | 23318422 |
| 发表日期 | 2024-02-28 |
| 语种 | 英语 |
| 产权排序 | 1 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/97275]  |
| 专题 | 西安光学精密机械研究所_瞬态光学技术国家重点实验室 |
| 作者单位 | 1.University of Chinese Academy of Sciences, Beijing; 100049, China 2.School of Biomedical Engineering, Anhui Medical University, Hefei; 230032, China; 3.Maastricht University Medical Center +, Maastricht; 6202 AZ, Netherlands; 4.State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an; 710119, China; |
| 推荐引用方式 GB/T 7714 | Zhang, Shuhe,Wang, Aiye,Xu, Jinghao,et al. FPM-WSI: Fourier ptychographic whole slide imaging via feature-domain backdiffraction. 2024. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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