Satellite Pose Measurement Using an Improving SIFT Algorithm
文献类型：会议论文
| 作者 | Zhang, Renhao2,3; Zhou, Zuofeng1,3
|
| 出版日期 | 2024 |
| 会议日期 | 2023-10-20 |
| 会议地点 | Changchun, China |
| 关键词 | Binocular Vision Stereo Matching Pose Measurement |
| 卷号 | 13063 |
| DOI | 10.1117/12.3021301 |
| 英文摘要 | Due to the strong reflective properties of the spacecraft surface coatings, there are significant challenges in processing images from outer space. Furthermore, the volume of data for image feature processing and matching is immense, and existing algorithms are insufficient for aerospace system applications. Therefore, this paper proposes a three-dimensional pose measurement algorithm based on binocular vision. The binocular vision-based three-dimensional pose measurement system consists of four main components: camera calibration, camera rectification, stereo matching, and pose determination. Traditional image processing algorithms are employed for satellite image processing. Camera calibration is performed using M software, and the calibration results are further optimized. Due to real-time requirements, an improved SIFT algorithm is used to detect local features in the images, extract feature points, and perform feature point matching under epipolar constraints. Experimental results demonstrate that this algorithm can achieve accurate and fast three-dimensional pose measurement. © 2024 SPIE. |
| 产权排序 | 1 |
| 会议录 | Fourth International Conference on Computer Vision and Data Mining, ICCVDM 2023
 |
| 会议录出版者 | SPIE |
| 语种 | 英语 |
| ISSN号 | 0277786X;1996756X |
| ISBN号 | 9781510674448 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/97273]  |
| 专题 | 西安光学精密机械研究所_动态光学成像研究室 |
| 作者单位 | 1.Xi’an Key Laboratory of Spacecraft Optical Imaging and Measurement Technology, Shaanxi, Xi'an; 710119, China 2.University of Chinese Academy of Sciences, Beijing; 100049, China; 3.Xi'an Institute of Optics and Precision Mechanics of UCAS, Chinese Academy of Sciences, Shaanxi, Xi'an; 710119, China; |
| 推荐引用方式 GB/T 7714 | Zhang, Renhao,Zhou, Zuofeng. Satellite Pose Measurement Using an Improving SIFT Algorithm[C]. 见:. Changchun, China. 2023-10-20. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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