中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Investigation on vibration induced fretting in degraded contact interface

文献类型:期刊论文

作者Qingya Li; Jinchun Gao; George T. Flowers; Wei Yi; Robert L. Jackson; Michael Hamilton
刊名MICROELECTRONICS RELIABILITY
出版日期2022
卷号139页码:114974
关键词Coaxial connector Contact surface failure Vibration induced fretting High frequency characteristic
ISSN号0026-2714
英文摘要

Connectors are widely used in electrical systems and are subject to a variety of degradation mechanisms that can negatively impact electrical performance. One major cause of degradation is vibration induced fretting. While there has been considerable work on the effects of general connector degradation and defects on high frequency characteristics, there has been little focused work that specifically considers effects of vibration induced fretting in actual coaxial connector systems.

Accordingly, in the present work, a detailed study of an example coaxial connector with a degraded contact surface was conducted, and the effects on vibration induced fretting are characterized using the high frequency results considering the parameters of resistance, capacitance, and inductance. The contact degradation process caused by the fretting was investigated using theoretical analysis, software simulation, and experimental tests. Simulations were performed to evaluate the high frequency behavior within a frequency range of 0.1 MHz to 1.0 GHz. An experimental investigation was conducted to investigate the effect of degraded contact surfaces on high frequency characteristics and provide validation for the model results. The simulation results were consistent with the measured results for both fresh and degraded connectors. Compared to the fresh condition, the S parameters and S 21 11 parameters of the first and second degradation levels increased and decreased, respectively. These results indicate that contact damage due to fretting in the sample system generally results in the deteri oration of high frequency properties and signal integrity.

出版地MICROELECTRONICS RELIABILITY
语种英语
出版者MICROELECTRONICS RELIABILITY
源URL[http://ir.ia.ac.cn/handle/173211/57081]  
专题国家专用集成电路设计工程技术研究中心_信号处理及脑机接口芯片
推荐引用方式
GB/T 7714
Qingya Li,Jinchun Gao,George T. Flowers,et al. Investigation on vibration induced fretting in degraded contact interface[J]. MICROELECTRONICS RELIABILITY,2022,139:114974.
APA Qingya Li,Jinchun Gao,George T. Flowers,Wei Yi,Robert L. Jackson,&Michael Hamilton.(2022).Investigation on vibration induced fretting in degraded contact interface.MICROELECTRONICS RELIABILITY,139,114974.
MLA Qingya Li,et al."Investigation on vibration induced fretting in degraded contact interface".MICROELECTRONICS RELIABILITY 139(2022):114974.

入库方式: OAI收割

来源:自动化研究所

浏览0
下载0
收藏0
其他版本

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。