中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Structural Design and Verification of an Effective-Area Measurement Device Detection System

文献类型:期刊论文

作者X. Chen, Z. Yun, T. You and X. Quan
刊名Sensors
出版日期2023
卷号23期号:19
ISSN号14248220
DOI10.3390/s23198215
英文摘要The effective-area method is a new way to measure aperture area. It defines aperture area by directly using the beam-limiting effect of the aperture in radiometric measurement. Due to the special structure of the measurement device, it is necessary to find a suitable method to design the detection system. In this paper, the measurement system model is constructed in the TracePro program. The real circumstances of light propagation for the measurement beam are simulated, and the responses of the detector are given. It is proved that the relative change in the detector response is the lowest when the detector is at the position of 132°. And this is the best structure design of the detection system. The experimental results are designed to verify the feasibility of the structure design of the detection system. © 2023 by the authors.
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源URL[http://ir.ciomp.ac.cn/handle/181722/67382]  
专题中国科学院长春光学精密机械与物理研究所
推荐引用方式
GB/T 7714
X. Chen, Z. Yun, T. You and X. Quan. Structural Design and Verification of an Effective-Area Measurement Device Detection System[J]. Sensors,2023,23(19).
APA X. Chen, Z. Yun, T. You and X. Quan.(2023).Structural Design and Verification of an Effective-Area Measurement Device Detection System.Sensors,23(19).
MLA X. Chen, Z. Yun, T. You and X. Quan."Structural Design and Verification of an Effective-Area Measurement Device Detection System".Sensors 23.19(2023).

入库方式: OAI收割

来源:长春光学精密机械与物理研究所

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