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Analysis and Prediction of Image Quality Degradation Caused by Diffraction of Infrared Optical System Turning Marks

文献类型：期刊论文

作者H. K. Ye, J. P. Zhang, S. N. Zhao, M. X. Liu and X. Zhang
刊名Photonics
出版日期2023
卷号10期号:8页码:18
DOI10.3390/photonics10080937
英文摘要This paper addresses the issue of reduced image quality due to annular turning marks formed by single-point diamond turning (SPDT) during the processing of metal-based mirrors and infrared lenses. An ideal single-point diamond turning marks diffraction action model to quantitatively analyze the impact of turning marks diffraction on imaging quality degradation is proposed. Based on this model, a fast estimation algorithm for the optical modulation transfer function of the system under turning marks diffraction (TMTF) is proposed. The results show that the TMTF algorithm achieves high computational accuracy, with a relative error of only 3% in diffraction efficiency, while being hundreds of times faster than rigorous coupled wave analysis (RCWA). This method is significant for reducing manufacturing costs and improving production efficiency, as it avoids the problem of being unable to compute large-size optical systems due to computational resource and time constraints.
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语种英语
源URL[http://ir.ciomp.ac.cn/handle/181722/68101]  
专题中国科学院长春光学精密机械与物理研究所
推荐引用方式
GB/T 7714		 H. K. Ye, J. P. Zhang, S. N. Zhao, M. X. Liu and X. Zhang. Analysis and Prediction of Image Quality Degradation Caused by Diffraction of Infrared Optical System Turning Marks[J]. Photonics,2023,10(8):18.
APA H. K. Ye, J. P. Zhang, S. N. Zhao, M. X. Liu and X. Zhang.(2023).Analysis and Prediction of Image Quality Degradation Caused by Diffraction of Infrared Optical System Turning Marks.Photonics,10(8),18.
MLA H. K. Ye, J. P. Zhang, S. N. Zhao, M. X. Liu and X. Zhang."Analysis and Prediction of Image Quality Degradation Caused by Diffraction of Infrared Optical System Turning Marks".Photonics 10.8(2023):18.

入库方式： OAI收割

来源：长春光学精密机械与物理研究所

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