Atomic-scale investigation of Si/Al interface in multilayer aluminum sheets using HRTEM and first-principle calculation
文献类型：期刊论文
| 作者 | Yuan, Zhipeng3; Chang, Jiashuo3; Tu, Yiyou2; Liu, Chen1,4; Yuan, Ting5; Huang, Liang3; Ni, Zenglei3; Wang, Xingxing3; Peng, Jin3; Ling, Zicheng3 |
| 刊名 | VACUUM
 |
| 出版日期 | 2023-10-01 |
| 卷号 | 216页码:8 |
| 关键词 | Microstructure Si Al interface Interface bonding strength First-principle calculation |
| ISSN号 | 0042-207X |
| DOI | 10.1016/j.vacuum.2023.112390 |
| 通讯作者 | Tu, Yiyou(tuyiyou@seu.edu.cn) ; Yuan, Ting(rabbityt@163.com) |
| 英文摘要 | The atomic-scale structure and electronic structure of the interface between Si precipitates and the Al matrix in multi-layered aluminum sheets are investigated by combining high-resolution transmission electron microscopy (HRTEM) with first-principles calculation. The results show that Si needle precipitates and Guinier Preston (GP) zones occur during the natural aging process of the core material in automotive heat exchangers. In addition, Al (Fe,Mn)Si precipitate can serve as effective heterogeneous nucleation sites for the formation of high-density Si precipitates during aging. The charge density differences analysis shows that the formation of covalent bonds between interfacial Si and Al atoms is crucial to the interfacial bonding strength. These results provide important insights for future research efforts focused on the production of multilayer aluminum sheets with highperformance. |
| WOS研究方向 | Materials Science ; Physics |
| 语种 | 英语 |
| WOS记录号 | WOS:001049449500001 |
| 出版者 | PERGAMON-ELSEVIER SCIENCE LTD |
| 源URL | [http://ir.imr.ac.cn/handle/321006/178894]  |
| 专题 | 金属研究所_中国科学院金属研究所 |
| 通讯作者 | Tu, Yiyou; Yuan, Ting |
| 作者单位 | 1.Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China 2.Southeast Univ, Sch Mat Sci & Engn, Nanjing 211189, Peoples R China 3.North China Univ Water Resources & Elect Power, Sch Mat Sci & Engn, Zhengzhou 450040, Peoples R China 4.Univ Sci & Technol China, Sch Mat Sci & Engn, Hefei 230026, Anhui, Peoples R China 5.Changshu Inst Technol, Sch Mat Engn, Changshu 215500, Peoples R China |
| 推荐引用方式 GB/T 7714 | Yuan, Zhipeng,Chang, Jiashuo,Tu, Yiyou,et al. Atomic-scale investigation of Si/Al interface in multilayer aluminum sheets using HRTEM and first-principle calculation[J]. VACUUM,2023,216:8. |
| APA | Yuan, Zhipeng.,Chang, Jiashuo.,Tu, Yiyou.,Liu, Chen.,Yuan, Ting.,...&Ling, Zicheng.(2023).Atomic-scale investigation of Si/Al interface in multilayer aluminum sheets using HRTEM and first-principle calculation.VACUUM,216,8. |
| MLA | Yuan, Zhipeng,et al."Atomic-scale investigation of Si/Al interface in multilayer aluminum sheets using HRTEM and first-principle calculation".VACUUM 216(2023):8. |
入库方式： OAI收割
来源：金属研究所
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