Replica-assisted super-resolution fluorescence imaging in scattering media
文献类型：预印本
| 作者 | Wu, Tengfei1,2; Baek, Yoonseok2; Xia, Fei2; Gigan, Sylvain2; de Aguiar, Hilton B.2 |
| 英文摘要 | ar-field super-resolution fluorescence microscopy has been rapidly developed for applications ranging from cell biology to nanomaterials. However, it remains a significant challenge to achieve super-resolution imaging at depth in opaque materials. In this study, we present a super-resolution microscopy technique for imaging hidden fluorescent objects through scattering media, started by exploiting the inherent object replica generation arising from the memory effect, i.e. the seemingly informationless emission speckle can be regarded as a random superposition of multiple object copies. Inspired by the concept of super-resolution optical fluctuation imaging, we use temporally-fluctuating speckles to excite fluorescent signals and perform high-order cumulant analysis on the fluctuation, which can not only improve the image resolution, but also increase the speckle contrast to isolate only the bright object replicas. A super-resolved image can be finally retrieved by simply unmixing the sparsely distributed replicas with their location map. This methodology allows to overcome scattering and achieve robust super-resolution fluorescence imaging, circumventing the need of heavy computational steps. Copyright © 2024, The Authors. All rights reserved. |
| 出处 | arXiv |
| 出版者 | arXiv |
| ISSN号 | 23318422 |
| 发表日期 | 2024-04-30 |
| 语种 | 英语 |
| 产权排序 | 1 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/97527]  |
| 专题 | 西安光学精密机械研究所_瞬态光学技术国家重点实验室 |
| 作者单位 | 1.State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an; 710119, China 2.Laboratoire Kastler Brossel, ENS- Université PSL, CNRS, Sorbonne Université, Collège de France. 24 rue Lhomond, Paris; 75005, France; |
| 推荐引用方式 GB/T 7714 | Wu, Tengfei,Baek, Yoonseok,Xia, Fei,et al. Replica-assisted super-resolution fluorescence imaging in scattering media. 2024. |
入库方式： OAI收割
来源：西安光学精密机械研究所
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