中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Evaluation of chemical mechanical polishing characteristics using mixed abrasive slurry: A study on polishing behavior and material removal mechanism

文献类型:期刊论文

作者Zhu, Xiaoxiao2,3; Ding, Juxuan2,3; Mo, Zhangchao2,3; Jiang, Xuesong1; Sun, Jifei1; Fu, Hao2,3; Gui, Yuziyu2,3; Ban, Boyuan2; Wang, Ling2; Chen, Jian1,2
刊名APPLIED SURFACE SCIENCE
出版日期2025-01-15
卷号679
关键词Chemical mechanical polishing (CMP) Ceria abrasive Diamond abrasive Interfacial chemical reaction Material removal mechanism
ISSN号0169-4332
DOI10.1016/j.apsusc.2024.161157
通讯作者Chen, Jian(jchen@ipp.ac.cn)
英文摘要Chemical mechanical polishing (CMP) is currently the most widely used method for material removal and surface planarization of glass. An environmentally friendly method of improving polishing performance by using a mixed abrasive slurry of ceria and diamond was proposed in this study. The results of polishing experiments showed that compared with single ceria abrasive, the materials removal rate (MRR) of the mixed abrasive slurry increased from 82.7 nm/min to 109.6 nm/min, while the surface roughness (Ra) decreased from 26.4 nm to 0.6 nm after polishing. An amorphous reaction layer formed during the CMP process was observed directly using transmission electron microscopy. Thermodynamic analysis was conducted to investigate the interfacial chemical reactions during the polishing process. A model was proposed to describe the mechanism of the materials removal.
WOS关键词MECHANOCHEMICAL REACTIONS ; COMPOSITE-PARTICLES ; SURFACE ; CEO2 ; CMP ; WAFER ; PERFORMANCE ; EFFICIENCY ; GRITS ; CE3+
资助项目National Natural Science Foundation of China[51874272] ; National Natural Science Foundation of China[51804294] ; National Natural Science Foundation of China[52111540265] ; Anhui Provincial Natural Science Foundation[1808085ME121] ; Key Laboratory of Photovoltaic and Energy Conservation Materials, Chinese Academy of Science[PECL2021QN003] ; HFIPS President Foundation[YZJJZX202018]
WOS研究方向Chemistry ; Materials Science ; Physics
语种英语
WOS记录号WOS:001312738400001
出版者ELSEVIER
资助机构National Natural Science Foundation of China ; Anhui Provincial Natural Science Foundation ; Key Laboratory of Photovoltaic and Energy Conservation Materials, Chinese Academy of Science ; HFIPS President Foundation
源URL[http://ir.hfcas.ac.cn:8080/handle/334002/135221]  
专题中国科学院合肥物质科学研究院
通讯作者Chen, Jian
作者单位1.Hefei Comprehens Natl Sci Ctr, Inst Energy, Hefei 230031, Peoples R China
2.Chinese Acad Sci, Inst Solid State Phys, Key Lab Photovolta & Energy Conservat Mat, HFIPS, Hefei 230031, Peoples R China
3.Univ Sci & Technol China, Hefei 230026, Peoples R China
推荐引用方式
GB/T 7714
Zhu, Xiaoxiao,Ding, Juxuan,Mo, Zhangchao,et al. Evaluation of chemical mechanical polishing characteristics using mixed abrasive slurry: A study on polishing behavior and material removal mechanism[J]. APPLIED SURFACE SCIENCE,2025,679.
APA Zhu, Xiaoxiao.,Ding, Juxuan.,Mo, Zhangchao.,Jiang, Xuesong.,Sun, Jifei.,...&Chen, Jian.(2025).Evaluation of chemical mechanical polishing characteristics using mixed abrasive slurry: A study on polishing behavior and material removal mechanism.APPLIED SURFACE SCIENCE,679.
MLA Zhu, Xiaoxiao,et al."Evaluation of chemical mechanical polishing characteristics using mixed abrasive slurry: A study on polishing behavior and material removal mechanism".APPLIED SURFACE SCIENCE 679(2025).

入库方式: OAI收割

来源:合肥物质科学研究院

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