A Pb-free Sn-Bi alloy mount preparation method for secondary ion mass spectrometry (SIMS) analyses
文献类型：期刊论文
| 作者 | Zhang, Wan-Feng2,4; Yang, Qing4; Xia, Xiao-Ping3; Zheng, De-Wen1; Cui, Ze-Xian4; Zhang, Yan-Qiang4; Xu, Yi-Gang2,4 |
| 刊名 | JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
 |
| 出版日期 | 2024-10-09 |
| 页码 | 8 |
| ISSN号 | 0267-9477 |
| DOI | 10.1039/d4ja00252k |
| 英文摘要 | Sample preparation is a critical step to achieve reliable in situ chemical analysis. Sample mounting technique with a tin-based alloy was developed in recent years, which is particularly useful for high-precision volatile analyses by secondary ion mass spectrometry (SIMS). However, the success of this technique is hindered by challenges, such as complex alloy preparation and potential Pb contamination. Herein, we introduce a new Sn-Bi alloy preparation method that may overcome these hurdles and assess its potential as a standard preparation method for in situ volatile and isotope analyses. This new alloy can be manufactured with commercially available pure tin and bismuth metal (atomic Sn : Bi = 42 : 58), and its production requires only a heating plate and clean containers. This ensures its high accessibility to laboratories worldwide. The Pb content of the alloy is dependent on the tin and bismuth used. The material (Sn and Bi) from three different manufacturers were evaluated in this study, resulting in the virtually Pb-free MAC alloy (Pb <0.2 mu g g(-1)). The SIMS U-Pb dating results of the zircon standards (Qinghu, Ple & scaron;ovice, and SA01) are consistent with the recommended values (within error). Furthermore, the mounted samples exhibit satisfactory relief on this alloy, suggesting that this alloy material is appropriate for the analysis of oxygen isotopes. The routine external precision of oxygen isotope ratios is better than 0.30 parts per thousand (2sd), on par with that obtained with epoxy mounts. The water background in the SIMS sample chamber can be recovered rapidly after sample transfer from the storage to the sample chamber. Hence, this tin-based alloy is suitable for sample mounting for SIMS volatile and isotope (incl. U-Pb) analyses. |
| WOS研究方向 | Chemistry ; Spectroscopy |
| 语种 | 英语 |
| WOS记录号 | WOS:001340565500001 |
| 源URL | [http://ir.gig.ac.cn/handle/344008/81261]  |
| 专题 | 同位素地球化学国家重点实验室 |
| 通讯作者 | Yang, Qing |
| 作者单位 | 1.China Earthquake Adm, Inst Geol, State Key Lab Earthquake Dynam, Beijing 100029, Peoples R China 2.Southern Marine Sci & Engn Guangdong Lab Guangzhou, Guangzhou 511458, Peoples R China 3.Yangtze Univ, Coll Resources & Environm, Wuhan 430100, Peoples R China 4.Chinese Acad Sci, State Key Lab Isotope Geochem, Guangzhou Inst Geochem, Guangzhou 510640, Peoples R China |
| 推荐引用方式 GB/T 7714 | Zhang, Wan-Feng,Yang, Qing,Xia, Xiao-Ping,et al. A Pb-free Sn-Bi alloy mount preparation method for secondary ion mass spectrometry (SIMS) analyses[J]. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY,2024:8. |
| APA | Zhang, Wan-Feng.,Yang, Qing.,Xia, Xiao-Ping.,Zheng, De-Wen.,Cui, Ze-Xian.,...&Xu, Yi-Gang.(2024).A Pb-free Sn-Bi alloy mount preparation method for secondary ion mass spectrometry (SIMS) analyses.JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY,8. |
| MLA | Zhang, Wan-Feng,et al."A Pb-free Sn-Bi alloy mount preparation method for secondary ion mass spectrometry (SIMS) analyses".JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY (2024):8. |
入库方式： OAI收割
来源：广州地球化学研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。